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WS57C191 Scheda tecnica(PDF) 4 Page - STMicroelectronics |
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WS57C191 Scheda tecnica(HTML) 4 Page - STMicroelectronics |
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4 / 7 page ![]() WS57C191C/291C 2-10 SYMBOL PARAMETER CONDITIONS TYP(5) MAX UNITS CIN Input Capacitance VIN = 0V 4 6 pF COUT Output Capacitance VOUT = 0V 8 12 pF CVPP VPP Capacitance VPP = 0 V 18 25 pF CAPACITANCE(4) T A = 25 °C, f = 1 MHz 30 pF (INCLUDING SCOPE AND JIG CAPACITANCE) 98 Ω 2.01 V D.U.T. A.C. TESTING INPUT/OUTPUT WAVEFORM TEST LOAD (High Impedance Test Systems) 3.0 0.0 1.5 1.5 TEST POINTS NOTE: 6. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters. A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between VCC and ground is recommended. Inadequate decoupling may result in access time degradation or other transient performance failures. NOTES: 4. This parameter is only sampled and is not 100% tested. 5.Typical values are for TA = 25°C and nominal supply voltages. A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V for a logic "0." Timing measurements are made at 1.5 V for input and output transitions in both directions. |
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