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TC55 Scheda tecnica(PDF) 3 Page - TelCom Semiconductor, Inc

Il numero della parte TC55
Spiegazioni elettronici  LOW DROPOUT POSITIVE VOLTAGE REGULATOR
PDF  3 Pages
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Produttore elettronici  TELCOM [TelCom Semiconductor, Inc]
Homepage  http://www.telcom-semi.com
Logo TELCOM - TelCom Semiconductor, Inc

TC55 Scheda tecnica(HTML) 3 Page - TelCom Semiconductor, Inc

  TC55 Datasheet HTML 1Page - TelCom Semiconductor, Inc TC55 Datasheet HTML 2Page - TelCom Semiconductor, Inc TC55 Datasheet HTML 3Page - TelCom Semiconductor, Inc  
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4-129
TELCOM SEMICONDUCTOR, INC.
7
6
5
4
3
1
2
8
TC55 Series
LOW DROPOUT
POSITIVE VOLTAGE REGULATOR
TC55RP30 ELECTRICAL CHARACTERISTICS: VOUT(S) = 5.0V, TA = 25°C unless otherwise specified (see REMARKS).
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
VOUT(A)
Output Voltage
IOUT = 40mA
—
—
—
V
VIN = 4.0V
2.94
3.0
3.06
IOUTmax
Maximum Output Current
VIN = 4.0V, VOUT(A) ≥ 2.7V
150
—
—
mA
∆VOUT
Load Regulation
VIN = 4.0V, 1 mA ≤ IOUT ≤ 80mA
—
45
90
mV
Vdif
I/O Voltage Difference
IOUT = 80mA
—
180
360
mV
IOUT = 160mA
—
400
700
ISS
Current Consumption
VIN = 4.0V
—
0.9
2.8
µA
VOUT(A)·100
Voltage Regulation
IOUT = 40mA
—
0.2
0.3
%/V
∆VIN·VOUT(S)
4.0V
≤ VIN ≤ 10.0V
VIN
Input Voltage
—
—
10.0
V
∆VOUT(A)·106
Temperature Coefficient
IOUT = 40mA
—
±100
—
ppm/
°C
∆TA·VOUT(S)
of Output Voltage
– 40
°C ≤ TA ≤ 85°C
Long Term Stability
TA = 125°C, 1000 Hours
—
0.5
—
%
MARKING
SOT-23A-3
SOT-89-3
x

Ž

x  Ž 
TO-92-3
8
12
4
7
11
3
6
10
2
5
9
1
represents first voltage digit
2
3456
ex: 3.xV =
kkkk
represents first decimal place voltage (x.0 - x.9)
A = x.0
E = x.4
L = x.8
B = x.1
F = x.5
M = x.9
C = x.2
H = x.6
D = x.3
K = x.7
ex: 3.4V =
kkkk
represents Polarity
0 = Positive (fixed)
represents assembly lot number
3
3E
,
,
&
= 55RP (fixed)
= first voltage digit (2-6)
= first voltage decimal (0-9)
= extra feature code : fixed : 0
= regulation accuracy
1 =
±1.0% (custom), 2 = ±2.0% (standard)
,
,
&
= assembly lot number
*Static-sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those
listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to Absolute Maximum Rating
Conditions for extended periods may affect device reliability.



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