SPT9689 datasheet(3/8 Pages) CADEKA

3 / 8 page

2/20/01

SPT9689

VIN+=100 mV (p-p), VOD=20 mV

VREF ± VOS

50%

tpL

Differential

Input Voltage

Output Q

t H

pdL

pdH

pLOL

pLOH

Latch Enable

VOD

TEST LEVEL CODES

All electrical characteristics are subject to the

following conditions:

All parameters having min/max specifications

are guaranteed. The Test Level column indi-

cates the specific device testing actually per-

formed during production and Quality Assur-

ance inspection. Any blank section in the data

column indicates that the specification is not

tested at the specified condition.

LEVEL

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA = +25 °C, and sample tested at the

specified temperatures.

III

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design and characteri-

zation data.

Parameter is a typical value for information purposes only.

100% production tested at TA = +25 °C. Parameter is guaranteed

over specified temperature range.

TIMING INFORMATION

The timing diagram for the comparator is shown in figure

1. If LE is high and LE low in the SPT9689, the comparator

tracks the input difference voltage. When LE is driven low

and LE high, the comparator outputs are latched into their

existing logic states.

The leading edge of the input signal (which consists of a

20 mV overdrive voltage) changes the comparator output

after a time of tpdL or tpdH (Q or Q). The input signal must

be maintained for a time tS (set-up time) before the LE fall-

ing edge and LE rising edge and held for time tH after the

falling edge for the comparator to accept data. After tH, the

output ignores the input status until the latch is strobed

again. A minimum latch pulse width of tpL is needed for

strobe operation, and the output transitions occur after a

time of tpLOH or tpLOL.

The set-up and hold times are a measure of the time

required for an input signal to propagate through the first

stage of the comparator to reach the latching circuitry.

Input signals occurring before tS will be detected and held;

those occurring after tH will not be detected. Changes

between tS and tH may not be detected.

Figure 1 – Timing Diagram

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