Motore di ricerca datesheet componenti elettronici
  Italian  ▼
ALLDATASHEETIT.COM

X  

LA112B-G.A-R1-PF Scheda tecnica(PDF) 7 Page - LIGITEK electronics co., ltd.

Il numero della parte LA112B-G.A-R1-PF
Spiegazioni elettronici  LED ARRAY
PDF  7 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Produttore elettronici  LIGITEK [LIGITEK electronics co., ltd.]
Homepage  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LA112B-G.A-R1-PF Scheda tecnica(HTML) 7 Page - LIGITEK electronics co., ltd.

  LA112B-G.A-R1-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LA112B-G.A-R1-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LA112B-G.A-R1-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LA112B-G.A-R1-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LA112B-G.A-R1-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LA112B-G.A-R1-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd. LA112B-G.A-R1-PF Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
Zoom Inzoom in Zoom Outzoom out
 7 / 7 page
background image
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
1.T.Sol=230
℃±5
2.Dwell time=5
±1sec
Solderability Test
This test intended to see soldering well
performed or not.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
MIL-STD-883:1008
JIS C 7021: B-10
MIL-STD-202:103B
JIS C 7021: B-11
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
JIS C 7021: B-12
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
The purpose of this is the resistance of
the device which is laid under ondition
of high temperature for hours.
High Temperature
Storage Test
1.Ta=105
℃±5
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=-40
℃±5
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=105
℃±5&-40℃±5
(10min) (10min)
2.total 10 cycles
1.Ta=65
℃±5
2.RH=90 %~95%
3.t=240hrs
±2hrs
1.T.Sol=260
℃±5
2.Dwell time= 10
±1sec.
Thermal Shock Test
Solder Resistance
Test
High Temperature
High Humidity Test
Low Temperature
Storage Test
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
The purpose of this test is the resistance
of the device under tropical for hous.
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
Test Condition
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
Reliability Test:
Test Item
Operating Life Test
PART NO. LA112B/G.A/R1-PF
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
Description
Reference
Standard
Page 6/6



Html Pages

1 2 3 4 5 6 7


Scheda tecnica Scarica

Go To PDF Page


Link URL



Lei ha avuto il aiuto da alldatasheet?  [ DONATE ] 

Di alldatasheet   |   Richest di pubblicita   |   contatti   |   Privacy Policy   |   Collegamento alla scheda tecnica    |   scambio Link   |   Ricerca produttore
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com