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74LVC1G74 Scheda tecnica(PDF) 13 Page - NXP Semiconductors |
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74LVC1G74 Scheda tecnica(HTML) 13 Page - NXP Semiconductors |
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13 / 25 page ![]() 74LVC1G74 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 10 — 2 December 2011 13 of 25 NXP Semiconductors 74LVC1G74 Single D-type flip-flop with set and reset; positive edge trigger Test data is given in Table 11. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to the output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 10. Test circuit for measuring switching times VEXT VCC VI VO mna616 DUT CL RT RL RL G Table 11. Test data Supply voltage Input Load VEXT VCC VI tr, tf CL RL tPLH, tPHL tPZH, tPHZ tPZL, tPLZ 1.65 V to 1.95 V VCC 2.0ns 30pF 1k open GND 2VCC 2.3 V to 2.7 V VCC 2.0 ns 30 pF 500 open GND 2VCC 2.7 V 2.7 V 2.5 ns 50 pF 500 open GND 6 V 3.0 V to 3.6 V 2.7 V 2.5 ns 50 pF 500 open GND 6 V 4.5 V to 5.5 V VCC 2.5 ns 50 pF 500 open GND 2VCC |
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