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HS7541AJS Scheda tecnica(PDF) 3 Page - Sipex Corporation |
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HS7541AJS Scheda tecnica(HTML) 3 Page - Sipex Corporation |
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3 / 7 page ![]() HS7541A 12-Bit CMOS Multiplying DAC © Copyright 2000 Sipex Corporation 3 SPECIFICATIONS (continued) (T A=25°C; VDD =+15V, VREF = +10V; IO1 = IO2 = GND = 0V; unipolar unless otherwise noted.) PARAMETER MIN. TYP. MAX. UNIT CONDITIONS DIGITAL INPUTS Logic Levels V IH 2.4 V DD Volts 2.4 Volts Note 5 V IL -0.3 0.8 Volts 0.8 Volts Note 5 Input Current ±1.0 µAV IN = 0V or VDD ±10 µA Note 5 and 15 Input Capacitance V IN = 0; Note 5 and 14 Bits 1—12 8 pF Note 5 Coding Unipolar Binary Bipolar Offset Binary POWER REQUIREMENTS Voltage Range +5 +15 Volts Note 16 +16 Volts Note 5 Supply Current 2.0 2.5 mA All digital inputs V IL or VIH 2.5 mA Note 5; all digital inputs V IL or V IH 0.2 0.5 mA All digital inputs 0V or 5V to V DD 1.0 mA Note 5; all digital inputs 0V or 5V to V DD ENVIRONMENTAL AND MECHANICAL Operating Temperature -AK, -AJ 0 +70 °C -AB, -AA -40 +85 °C Storage Temperature -65 +150 °C Package -AK, -AJ 18-pin plastic DIP, 20-pin PLCC, 18–pin SOIC Notes and Cautions: 1. Do not apply voltages higher than VDD or less than GND potential on any terminal other than V REF or VRFB. 2. The digital inputs are diode-clamp protected against ESD damage. However, permanent damage may occur on unprotected units from high-energy electrostatic fields. Keep units in conductive foam at all times until ready to use. 3. Use proper anti-static handling procedures. 4. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation at or above these specifications is not implied. Exposure to the above maximum rated conditions for extended periods may affect device reliability. 5. From T MIN to TMAX. 6. Integral Non-linearity is measured as the arithmetic mean value of the magnitudes of the greatest positive deviation and the greatest negative deviation from the theoretical value of any given input combination. 7. Differential Non-linearity is the deviation of an output step from the theoretical value of 1 LSB for any two adjacent digital input codes. 8. AC performance characteristics are included for design guidance only and are subject to sample testing only. 9. R L = 100Ω, CEXT = 13pF; all data inputs 0V to VDD or VDD to 0V; from 50% digital input change to 90% of final analog output. 10. Settling to ±0.01% FSR (strobed); all data inputs 0V to V DD or VDD to 0V. 11. V REF = 0V, DAC register alternatively loaded with all 0’s and all 1’s. 12. V REF = 20VP-P; F = 10kHz sinewave. 13. V REF = 20VP-P; F = 1kHz sinewave. 14. Guaranteed by design, but not production tested. 15. Logic inputs are MOS gates. I IN typically is less than 1nA @ 25°C. 16. Accuracy is guaranteed at V DD = +15V only. 17. Measured using internal feedback resistor with DAC loaded with all 1’s. 18. All digital inputs = 0V. |
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