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ACT-S128K32V-035P7Q Scheda tecnica(PDF) 4 Page - Aeroflex Circuit Technology

Il numero della parte ACT-S128K32V-035P7Q
Spiegazioni elettronici  ACT-S128K32V High Speed 3.3Volt 4 Megabit SRAM Multichip Module
PDF  7 Pages
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Produttore elettronici  AEROFLEX [Aeroflex Circuit Technology]
Homepage  http://www.aeroflex.com
Logo AEROFLEX - Aeroflex Circuit Technology

ACT-S128K32V-035P7Q Scheda tecnica(HTML) 4 Page - Aeroflex Circuit Technology

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Aeroflex Circuit Technology ACT-S128K32V
SCD3359 REV B 12/17/98 Plainview NY (516) 694-6700
4
Timing Diagrams
DI/O
tRC
tOH
tAA
Data Valid
Previous Data Valid
tOE
High Z
tOHZ
Read Cycle Timing Diagrams
Data Valid
tCLZ
CE
OE
tACS
tCHZ
UNDEFINED
DON’T CARE
Read Cycle 2 (WE = VIH)
Write Cycle 2 (CE Controlled, OE = VIH )
DI/O
AC Test Circuit
IOL
Parameter
Typical
Units
Input Pulse Level
0 – 3.0
V
Input Rise and Fall
5
ns
Input and Output Timing Reference
Level
1.5
V
Notes:
1) VZ is programmable from -2V to +4.6V. 2) IOL and IOH programmable from 0 to 16 mA. 3) Tester Impedance
ZO = 75
Ω. 4) VZ is typically the midpoint of VOH and VOL. 5) IOL and IOH are adjusted to simulate a typical resistance
load circuit. 6) ATE Tester includes jig capacitance.
IOH
To Device Under Test
VZ ~ 1.5 V (Bipolar Supply)
Current Source
Current Source
CL =
50 pF
tRC
tAA
tOLZ
SEE NOTE
SEE NOTE
SEE NOTE
SEE NOTE
Note: Guaranteed by design, but not tested.
Read Cycle 1 (CE = OE = VIL, WE = VIH)
tWP
tDW
Data Valid
tWC
tAW
tAH
DI/O
tDH
CE
WE
tCW
tAS
A0-18
A0-18
A0-18
tCW
tAS
tWP
tDW
tOW
CE
WE
Data Valid
tWC
tAW
tAH
DI/O
tDH
tWHZ
SEE NOTE
A0-16
SEE NOTE
Write Cycle Timing Diagrams
Write Cycle 1 (WE Controlled, OE = VIL)



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