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74HC393D Scheda tecnica(PDF) 12 Page - NXP Semiconductors |
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74HC393D Scheda tecnica(HTML) 12 Page - NXP Semiconductors |
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12 / 21 page ![]() 74HC_HCT393 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 4 — 16 May 2013 12 of 21 NXP Semiconductors 74HC393; 74HCT393 Dual 4-bit binary ripple counter Measurement points are given in Table 8. a. Input pulse definition Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. b. Test circuit Fig 11. Test circuit for measuring switching times 001aac221 VM VM tW tW 10 % 90 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % 10 % tf tr tr tf mna101 VCC VI VO RT CL PULSE GENERATOR D.U.T. Table 9. Test data Type Input Load VI tr, tf CL 74HC393 VCC 6 ns 15 pF, 50 pF 74HCT393 3 V 6 ns 15 pF, 50 pF |
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