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HCS244D/Sample Scheda tecnica(PDF) 5 Page - Intersil Corporation

Il numero della parte HCS244D/Sample
Spiegazioni elettronici  Radiation Hardened Octal Buffer/Line Driver, Three-State
PDF  10 Pages
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Produttore elettronici  INTERSIL [Intersil Corporation]
Homepage  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation

HCS244D/Sample Scheda tecnica(HTML) 5 Page - Intersil Corporation

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Specifications HCS244MS
Output Voltage Low
VOL
VCC = 4.5V and 5.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), IOL = 50
µA
+25oC
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V and 5.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), IOH = -50
µA
+25oC
VCC
-0.1
-V
Three-State Output
Leakage Current
IOZ
Applied Voltage = 0V or 5.5V, VCC = 5.5V
+25oC-
±50
µA
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25oC-
±5
µA
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), (Note 3)
+25oC
---
Propagation Delay Data
to Output
TPLH,
TPHL
VCC = 4.5V
+25oC
2
25
ns
Enable to Output
TPZL
VCC = 4.5V
+25oC
2
30
ns
Enable to Output
TPZH
VCC = 4.5V
+25oC
2
24
ns
Disable to Output
TPLZ,
TPHZ
VCC = 4.5V
+25oC
2
30
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO
≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12
µA
IOL/IOH
5
-15% of 0 Hour
IOZL/IOZH
5
±200nA
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Spec Number
518763



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