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LT1792

ELECTRICAL C

HARA TERISTICS The q denotes specifications which apply over the temperature range

–40

°C ≤ TA ≤ 85°C. VS = ±15V, VCM = 0V, unless otherwise noted. (Notes 8, 9)

SYMBOL

PARAMETER

CONDITIONS (Note 2)

MIN

TYP

MAX

MIN

TYP

MAX

UNITS

VOS

Input Offset Voltage

0.5

1.0

1.2

3.7

VS = ±5V

0.8

1.4

1.5

4.2

∆VOS

Average Input Offset

(Note 6)

410

µV/°C

∆Temp

Voltage Drift

IOS

Input Offset Current

300

800

300

800

Input Bias Current

1200

4000

1200

4000

VCM

Input Voltage Range

12.6

13.0

12.6

13.0

–10.0

–10.5

–10.0

–10.5

CMRR

Common Mode Rejection Ratio

VCM = –10V to 12.6V

103

PSRR

Power Supply Rejection Ratio

VS = ±4.5V to ± 20V

AVOL

Large-Signal Voltage Gain

VO = ±12V, RL = 10k

850

3300

750

3000

V/mV

VO = ±10V, RL = 1k

400

2200

300

2000

V/mV

VOUT

Output Voltage Swing

RL = 10k

±12.8 ±13.1

RL = 1k

±11.8 ±12.1

Slew Rate

RL ≥ 2k

2.0

3.0

2.0

3.0

µs

GBW

Gain-Bandwidth Product

fO = 100kHz

2.9

4.3

2.9

4.3

MHz

Supply Current

4.2

5.40

4.2

5.40

VS = ±5V

4.2

5.35

4.2

5.35

Note 6: This parameter is not 100% tested.

Note 7: Slew rate is measured in AV = – 1; input signal is ±7.5V, output

measured at

±2.5V.

Note 8: The LT1792AC and LT1792C are guaranteed to meet specified

performance from 0

°C to 70°C and are designed, characterized and

expected to meet these extended temperature limits, but are not tested at

–40

°C and 85°C. The LT1792I is guaranteed to meet the extended

temperature limits. The LT1792AC and LT1792AI grade are 100%

temperature tested for the specified temperature range.

Note 9: The LT1792 is measured in an automated tester in less than one

second after application of power. Depending on the package used,

power dissipation, heat sinking, and air flow conditions, the fully

warmed-up chip temperature can be 10

°C to 50°C higher than the

ambient temperature.

Note 1: Absolute Maximum Ratings are those values beyond which the

life of a device may be impaired.

Note 2: Typical parameters are defined as the 60% yield of parameter

distributions of individual amplifiers.

Note 3: Warmed-up IB and IOS readings are extrapolated to a chip

temperature of 32

°C from 25°C measurements and 32°C characterization

data.

Note 4: Current noise is calculated from the formula:

in = (2qIB)1/2

where q = 1.6 • 10 –19 coulomb. The noise of source resistors up to 200M

swamps the contribution of current noise.

Note 5: Input voltage range functionality is assured by testing offset

voltage at the input voltage range limits to a maximum of 2.3mV

(A grade), to 2.8mV (C grade).

LT1792AC/LT1792AI

LT1792C/LT1792I

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