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AN3357 Scheda tecnica(PDF) 2 Page - STMicroelectronics |
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AN3357 Scheda tecnica(HTML) 2 Page - STMicroelectronics |
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2 / 10 page ![]() Location for HSP061-8M16 AN3357 2/10 Doc ID 018580 Rev 1 1 Location for HSP061-8M16 Many PCB parasitic elements may degrade the overall ESD performance of a system. The recommendations below are aimed at optimizing ESD protection device placement and the PCB layout to reach the best ESD performance possible. The layout shown in Figure 1 may induce parasitic inductances responsible for artificial overvoltages directly applied on the IC to be protected. A very simple calculation shows that for a 15 kV ESD contact surge according to IEC61000-4-2, the overvoltage due to parasitic inductances may be really significant, as shown in Figure 2. This test is done with a contact discharge as the air discharge waveform is not defined in the IEC 61000-4-2 specification. Assuming that each inductance value is 5 nH (corresponds to metal track 5 mm long): then the overvoltage seen by the IC is: This parasitic inductance must be reduced as much as possible by shortening the ground path return to the GND via. To avoid ESD propagation on the PCB, the ESD protection must be placed as close as possible to the ESD source with the layout given in the datasheet. The layout given in the datasheet reduces parasitic inductance. It is important to connect the connector on one side of the HSP and the transceiver on the other side. The GND via on both sides must be used. As ESD stress can be propagated on both sides of the cable, a protection device on each end of the cable is required. Figure 1. Non-optimized location for HSP061-8M16 Figure 2. Significant overvoltages due to non-optimal location of HSP061-8M16 Via to GND IC to protect Via to GND 2 4 5 3 6 7 8 1 16 15 13 12 14 11 10 9 16 G N D IC to protect Via to GND V dt di L VIC ESD surge is 15 kV with 1 ns rise time, this leads to 71 A/ ns GND layer di dt = 71 A/ns L· di dt V = V + IC V = V + 355 V IC |
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