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LT1124 Scheda tecnica(PDF) 9 Page - Linear Technology

Il numero della parte LT1124
Spiegazioni elettronici  Dual/Quad Low Noise, High Speed Precision Op Amps
PDF  16 Pages
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Produttore elettronici  LINER [Linear Technology]
Homepage  http://www.linear.com
Logo LINER - Linear Technology

LT1124 Scheda tecnica(HTML) 9 Page - Linear Technology

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9
LT1124/LT1125
High Speed Operation
When the feedback around the op amp is resistive (RF),
a pole will be created with RF, the source resistance and
capacitance (RS, CS), and the amplifier input capacitance
(CIN ≈ 2pF). In low closed loop gain configurations and
with RS and RF in the kilohm range, this pole can create
excess phase shift and even oscillation. A small capacitor
(CF) in parallel with RF eliminates this problem (see
Figure 2). With RS (CS + CIN) = RFCF, the effect of the
feedback pole is completely removed.
During the fast feedthrough-like portion of the output, the
input protection diodes effectively short the output to the
input and a current, limited only by the output short circuit
protection, will be drawn by the signal generator. With RF
≥500Ω, the output is capable of handling the current
requirements (IL ≤ 20mA at 10V) and the amplifier stays
in its active mode and a smooth transition will occur.
Noise Testing
Each individual amplifier is tested to 4.2nV/
√Hz voltage
noise; i.e., for the LT1124 two tests, for the LT1125 four
tests are performed. Noise testing for competing multiple
op amps, if done at all, may be sample tested or tested
using the circuit shown in Figure 4.
en OUT = (enA)2 + (enB)2 + (enC)2 + (enD)2
If the LT1125 were tested this way, the noise limit would
be
4 • (4.2nV/√Hz)2 = 8.4nV/√Hz. But is this an effective
screen? What if three of the four amplifiers are at a typical
2.7nV/
√Hz, and the fourth one was contaminated and has
6.9nV/
√Hz noise?
RMS Sum =
(2.7)2 + (2.7)2 + (2.7)2 + (6.9)2 = 8.33nV/√Hz
This passes an 8.4nV/
√Hz spec, yet one of the amplifiers
is 64% over the LT1125 spec limit. Clearly, for proper
noise measurement, the op amps have to be tested
individually.
S
APPLICATI
I FOR ATIO
+
1124/25 F03
OUTPUT
4.5V/
µs
RF
Figure 3. Unity-Gain Buffer Applications
1124/25 F04
+
A
+
B
+
C
+
D
OUT
Figure 4. Competing Quad Op Amp Noise Test Method
+
OUTPUT
1124/25 F02
RS
CS
RF
CF
CIN
Figure 2. High Speed Operation
Unity Gain Buffer Applications
When RF ≤ 100Ω and the input is driven with a fast, large
signal pulse (>1V), the output waveform will look as
shown in Figure 3.



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