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UT54ACTS04E Scheda tecnica(PDF) 4 Page - Aeroflex Circuit Technology

Il numero della parte UT54ACTS04E
Spiegazioni elettronici  Hex Inverters
PDF  7 Pages
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Produttore elettronici  AEROFLEX [Aeroflex Circuit Technology]
Homepage  http://www.aeroflex.com
Logo AEROFLEX - Aeroflex Circuit Technology

UT54ACTS04E Scheda tecnica(HTML) 4 Page - Aeroflex Circuit Technology

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Notes:
* For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25×C per MIL-STD-883 Method 1019, Condition
A up to the maximum TID level procured.
1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, -
50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are
guaranteed to VIH(min) and VIL(max).
2. Supplied as a design limit but not guaranteed or tested.
3. Per MIL-PRF-38535, for current density
5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765pF/
MHz.
4. Not more than one output may be shorted at a time for maximum duration of one second.
5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at
frequency of 1MHz and a signal amplitude of 50mV rms maximum.
6. Maximum allowable relative shift equals 50mV.
7. Power dissipation specified per switching output.
8. Parameter guaranteed by design and characterization, but is not tested.
AC ELECTRICAL CHARACTERISTICS (Pre and Post-Radiation)*
(VDD = 3.0V to 5.5V; VSS = 0V
1, -55
C < T
C < +125C); Unless otherwise noted, Tc is per the temperature range ordered
Notes:
* For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25×C per MIL-STD-883 Method 1019, Condition
A up to the maximum TID level procured.
1. Maximum allowable relative shift equals 50mV.
Ptotal2
Power dissipation 2, 7
CL = 50pF
VDD = 3.0V to 3.6V
0.5
mW/
MHz
IDDQ
Quiescent Supply Current
VIN = VDD or VSS
VDD from 3.6V to 5.5V
10
A
I
DDQ
Quiescent Supply Current Delta
For input under test
VIN = VDD - 2.1V
For all other inputs
VIN = VDD or VSS
VDD = 5.5V
1.6
mA
CIN
Input capacitance 5
 = 1MHz
VDD = 0V
15
pF
COUT
Output capacitance 5
 = 1MHz
VDD = 0V
15
pF
SYMBOL
PARAMETER
CONDITION
VDD
MINIMUM
MAXIMUM
UNIT
tPLH
Input to Yn
CL = 50pF
3.0V to 3.6V
2
14
ns
4.5V to 5.5V
1
7
tPHL
Input to Yn
CL = 50pF
3.0V to 3.6V
2
14
ns
4.5V to 5.5V
1
7



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