The following specifications apply for V

all other limits T

Symbol

Parameter

Conditions

Typical

(Note 7)

Limit

(Note 8)

Units

(Limit)

V

IL

Logic “0” Input Voltage

V

CS, WR, RD, A0, A1, A2 Pins

0.8

V (max)

Mode Pin

1.5

I

IH

Logic “1” Input Current

V

CS, RD, A0, A, A2 Pins

0.005

1

WR Pin

0.1

3

µA (max)

Mode Pin

50

200

I

IL

Logic “0” Input Current

V

CS, RD, WR, A0, A1, A2

Mode Pins

−0.005

−2

µA (max)

V

OH

Logic “1” Output Voltage

V

I

2.4

V (min)

DB0–DB7, OFL, INT

I

4.5

V (min)

DB0–DB7, OFL, INT

V

OL

Logic “0” Output Voltage

V

I

0.4

V (max)

DB0–DB7, OFL, INT, RDY

I

O

TRI-STATE Output Current

V

0.1

3

µA (max)

DB0–DB7, RDY

V

−0.1

−3

µA (max)

DB0–DB7, RDY

I

SOURCE

Output Source Current

V

−26

−6

mA (min)

DB0–DB7, OFL, INT

I

SINK

Output Sink Current

V

24

7

mA (min)

DB0–DB7, OFL, INT, RDY

I

C

Supply Current

CS = WR = RD = 0

11.5

20

mA (max)

C

OUT

Logic Output Capacitance

5

pF

C

IN

Logic Input Capacitance

5

pF

Bandgap Reference Electrical Characteristics

The following specifications apply for V

limits T

Symbol

Parameter

Conditions

Typical

Limits

Units

(Note 7)

(Note 8)

(Limit)

V

REFOUT

Internal Reference Output Voltage

V (max)

∆V

Internal Reference Temperature

40

ppm/˚C

Coefficient

∆V

Internal Reference Load

Sourcing (0

≤ I

0.01

0.1

%/mA (max)

Regulation

Line Regulation

4.75V

0.5

6.0

mV (max)

I

SC

Short Circuit Current

V

35

mA (max)

∆V

Long Term Stability

200

ppm/kHr

Start-Up Time

V

40

ms

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating

the device beyond its specified operating ratings. Operating Ratings indicate conditions for which the device is functional, but do not guarantee performance limits.

For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some per-

formance characteristics may degrade when the device is not operated under the listed test conditions.

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