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TAS3103DBT Scheda tecnica(PDF) 44 Page - Texas Instruments |
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TAS3103DBT Scheda tecnica(HTML) 44 Page - Texas Instruments |
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44 / 146 page ![]() 2−12 L2 LRCLK R2 L3 R3 L4 R4 L1, R1 L2, R2 L3, R3 L0 R0 L1 R1 L2 L1, R1 L2, R2 L3, R3 R0 L1 R1 L2 R2 L3 SDIN Processing Cycle Load Output Holding Registers Holding Register ⇒ Output Serial Registers SDOUT 2.5 Cycle Delay 1.5 Cycle Delay Processing Cycle Load Output Holding Registers Holding Register ⇒ Output Serial Registers SDOUT (a) Left-Justified Input / I2S Output L2 LRCLK R2 L3 R3 L4 R4 L1, R1 L2, R2 L3, R3 L0 R0 L1 R1 L2 L1, R1 L2, R2 L3, R3 R0 L1 R1 L2 R2 L3 SDIN Processing Cycle Load Output Holding Registers Holding Register ⇒ Output Serial Registers SDOUT 2.5 Cycle Delay 1.5 Cycle Delay Processing Cycle Load Output Holding Registers Holding Register ⇒ Output Serial Registers SDOUT (b) I2S Input / Left-Justified Output Figure 2−13. SAP Input-to-Output Latency for I2S Format Conversions The delay from input to output can thus be either 1.5 or 2.5 sample times when data format conversions are performed that involves the I2S format. However, which delay time is obtained for a particular application is determinable and fixed for that application, providing care is taken in the selection of MCLKI/XTALI with respect to the incoming sample clock LRCLK. |
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