CS5530 datasheet(224/241 Pages) NSC

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Revision 4.1

5.0

Electrical Specifications

This section provides information on testing modes, elec-

trical connections, absolute maximum ratings, recom-

mended operating conditions, and DC/AC characteristics

for the Geode CS5530. All voltage values in Electrical

Specifications are with respect to VSS unless otherwise

noted.

For detailed information on the PCI bus electrical specifi-

cation refer to Chapter 4 of the PCI Bus Specification,

Revision 2.1.

5.1

TEST MODES

The CS5530 can be forced into different test modes. Table

5-1 summarizes the test mode selection process.

Table 5-1. Test Mode Selection

Mode

Signal Name

POR#

TEST

IRQ3

IRQ4

IRQ5

IRQ6

IRQ7

Test mode: X_CLK is a direct clock, stays until

POR# event

1001

Test USB pads

1010

NAND tree test, IDDQ test, tristate control: PLL,

USB pads, and DAC are all in power-down mode

(see Section 5.1.1 “Nand Tree Mode” on page 225)

xxx

PLL test

1100

X-Bus test: Allows internal X-Bus to be driven

externally

1101

BIST for palette and video RAMs

1110

DAC test

1111

IRQ6 = 1 as well; USB test

1000

SCAN_MODE = 1, SCAN_ENABLE = 0,

TEST_CLOCK = PAD_DCC_SDA

1100

SCAN_MODE = 1, SCAN_ENABLE = 1,

TEST_CLOCK = PAD_DCC_SDA,

X-BUS_DISABLE = 1

1101

Note:

x = Don’t Care

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