AD1981A datasheet(5/24 Pages) AD

5 / 24 page

REV. 0

AD1981A

–5–

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection. Although

the AD1981A features proprietary ESD protection circuitry, permanent damage may occur on

devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are

recommended to avoid performance degradation or loss of functionality.

WARNING!

ESD SENSITIVE DEVICE

ORDERING GUIDE

Temperature

Package

Model

Range

Description

Option

AD1981AJST

°C to 70°C

48-Lead LQFP

ST-48

*ST = Thin Quad Flatpack

ABSOLUTE MAXIMUM RATINGS

(TA = 25

°C unless otherwise noted.)

Power Supplies

Digital (DVDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +3.6 V

Analog (AVDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6.0 V

Input Current (except Supply Pins) . . . . . . . . . . . . . . .

±10 mA

Signals Pins

Digital Input Voltage . . . . . . . . . . . . . –0.3 V to DVDD +0.3 V

Analog Input Voltage . . . . . . . . . . . . –0.3 V to AVDD +0.3 V

Ambient Temperature Range (Operating) . . . . . . . 0

°C to 70°C

Ambient Temperature Rating (TQFP Package)

TAMB = TCASE – ( PD

CA )

TCASE = Case Temperature in

°C

PD = Power Dissipation in W

JA Thermal Resistance (Junction-to-Ambient) . . . 76.2

°C/W

JC Thermal Resistance (Junction-to-Case) . . . . . . .

°C/W

JA Thermal Resistance (Case-to-Ambient) . . . . .

52.2

°C/W

Storage Temperature Range . . . . . . . . . . . . –65

°C to +150°C

*Stresses greater than those listed under Absolute Maximum Ratings may cause

permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions above those indicated in

the operational section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

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