Not Recommended for New Designs

bq28550-R1

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SLUSAS4A – OCTOBER 2012 – REVISED SEPTEMBER 2014

9 Device and Documentation Support

9.1 Related Documentation

9.1.1 Documentation Support

For more information, see the bq28551-R1 Technical Reference Manual (SLUU889).

9.2 Trademarks

9.3 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

9.4 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.

Copyright © 2012–2014, Texas Instruments Incorporated

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