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OrderableDevice Scheda tecnica(PDF) 14 Page - Texas Instruments |
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OrderableDevice Scheda tecnica(HTML) 14 Page - Texas Instruments |
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14 / 25 page ![]() LMC6032 SNOS609C – NOVEMBER 1994 – REVISED MARCH 2013 www.ti.com BIAS CURRENT TESTING The test method of Figure 25 is appropriate for bench-testing bias current with reasonable accuracy. To understand its operation, first close switch S2 momentarily. When S2 is opened, then Figure 25. Simple Input Bias Current Test Circuit A suitable capacitor for C2 would be a 5 pF or 10 pF silver mica, NPO ceramic, or air-dielectric. When determining the magnitude of Ib−, the leakage of the capacitor and socket must be taken into account. Switch S2 should be left shorted most of the time, or else the dielectric absorption of the capacitor C2 could cause errors. Similarly, if S1 is shorted momentarily (while leaving S2 shorted) where Cx is the stray capacitance at the + input. 14 Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: LMC6032 |
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