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AM26C32MDREP Scheda tecnica(PDF) 6 Page - Texas Instruments

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Il numero della parte AM26C32MDREP
Spiegazioni elettronici  QUADRUPLE DIFFERENTIAL LINE RECEIVER
PDF  10 Pages
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Produttore elettronici  TI1 [Texas Instruments]
Homepage  http://www.ti.com
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AM26C32MDREP Scheda tecnica(HTML) 6 Page - Texas Instruments

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PARAMETER MEASUREMENT INFORMATION
TEST CIRCUIT
VOLTAGE WAVEFORMS
0 V
Output
VOH
VOL
10%
90%
90%
10%
tTLH
tTHL
tPLH
tPHL
2.5 V
−2.5 V
50%
Input
Device
Under
Test
A
B
VCC
CL = 50 pF
(see Note A)
Input
TEST CIRCUIT
Device
Under
Test
G Input
G Input
VCC
S1
RL = 1 kΩ
CL = 50 pF
(see Note A)
VID = ±2.5 V
VOLTAGE WAVEFORMS
tPZL, tPLZ Measurement: S1 to VCC
tPZH, tPHZ Measurement: S1 to GND
1.3 V
G
G
(see Note B)
Output
(with VID = 2.5 V)
Output
(with VID = −2.5 V)
tPZH
tPHZ
tPZH
tPHZ
tPZL
tPLZ
tPZL
tPLZ
VOH −0.5 V
VOL + 0.5 V
VOH −0.5 V
VOL + 0.5 V
3 V
0 V
3 V
0 V
VOH
VOL
VOH
VOL
1.3 V
50%
50%
A Input
B Input
AM26C32-EP
QUADRUPLE DIFFERENTIAL LINE RECEIVER
SLLS870 – NOVEMBER 2007
A.
CL includes probe and jig capacitance.
Figure 1. Switching Test Circuit and Voltage Waveforms
A.
CL includes probe and jig capacitance.
B.
The input pulse is supplied by a generator having the following characteristics: PRR = 1 MHz, duty cycle
≤ 50%, tr = tf
= 6 ns.
Figure 2. Enable/Disable Time Test Circuit and Output Voltage Waveforms
6
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Copyright © 2007, Texas Instruments Incorporated



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