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LHIRSBKS34493-R23 Scheda tecnica(PDF) 7 Page - LIGITEK electronics co., ltd.

Il numero della parte LHIRSBKS34493-R23
Spiegazioni elettronici  DURL COLOR LED LAMPS
PDF  7 Pages
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Produttore elettronici  LIGITEK [LIGITEK electronics co., ltd.]
Homepage  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LHIRSBKS34493-R23 Scheda tecnica(HTML) 7 Page - LIGITEK electronics co., ltd.

  LHIRSBKS34493-R23 Datasheet HTML 1Page - LIGITEK electronics co., ltd. LHIRSBKS34493-R23 Datasheet HTML 2Page - LIGITEK electronics co., ltd. LHIRSBKS34493-R23 Datasheet HTML 3Page - LIGITEK electronics co., ltd. LHIRSBKS34493-R23 Datasheet HTML 4Page - LIGITEK electronics co., ltd. LHIRSBKS34493-R23 Datasheet HTML 5Page - LIGITEK electronics co., ltd. LHIRSBKS34493-R23 Datasheet HTML 6Page - LIGITEK electronics co., ltd. LHIRSBKS34493-R23 Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
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1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
1.T.Sol=245
℃±5℃
2.Dwell time=5
±1sec
Solderability Test
This test intended to see soldering well
performed or not.
MIL-STD-202:103B
JIS C 7021: B-11
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
Solder Resistance
Test
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Thermal Shock Test
High Temperature
High Humidity Test
The purpose of this test is the resistance
of the device under tropical for hours.
Reliability Test:
PART NO. LHIRSBKS34493/R23
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
MIL-STD-883:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
JIS C 7021: B-12
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
High Temperature
Storage Test
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
Test Item
Test Condition
Reference
Standard
Description
Page6/6
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only



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