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LMV232TLX Scheda tecnica(PDF) 10 Page - National Semiconductor (TI) |
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LMV232TLX Scheda tecnica(HTML) 10 Page - National Semiconductor (TI) |
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10 / 13 page ![]() Application Notes (Continued) The detection curves of Figure 2 show the detector response to RF input power. To show the complete dynamic range on a logarithmic scale, the pedestal voltage (V PEDESTAL) is sub- tracted from the output. The pedestal voltage is defined as the output voltage in the absence of an RF input signal (at 25˚C). The best-fit ideal mean square response is repre- sented by the fitted curve in Figure 2. The input referred error of the detection curves with respect to this best-fit mean square response is determined as follows: • Determine the best-fit mean square response. • Determine the output referred error between the actual detector response and the ideal mean square response. • Translate the output referred error to an input referred error. The best-fit linear curve is obtained from the detector re- sponse by means of linear regression. The output referred error is calculated with the formula: Error dBV = 20*log[ (VOUT-VPEDESTAL)/(KDET*PIN)] Where, Conversion gain of the ideal fitted curve K DET is in V/mW and the RF input power P IN in mW. To translate this output referred error (in dB) to an input referred error, it has to be divided by a factor of 2. This is due to the mean square characteristic of the device. The re- sponse of a mean square detector changes by 2 dB for every dB change of the input power. Figure 3 depicts the resulting curve. Analyzing Figure 3 shows that three sections can be distin- guished: • At higher power levels the error increases. • A middle section where the error is constant and rela- tively small. • At lower power levels the error increases again. These three sections are leading back to three error mecha- nisms. At higher power levels the detectors output starts to saturate because the output voltage approaches the maxi- mum signal swing that the detector can handle. The maxi- mum output voltage of the device thus limits the upper end of the detection range. Also the maximum allowed ADC voltage of the baseband chip can limit the detection range at higher power levels. By adjusting the feedback resistor R FB of Figure 1 the upper end of the range can be shifted. This is valid until the detector cell inside the LMV232 is the limiting factor. The middle section of the error curve shows a small error variation. This is the section where the detector is used and is called the detection range of the detector. This range is limited on both sides by a maximum allowed error. For low input power levels, the variation of output voltage is very small. Therefore the measurement resolution ADC is important in order to measure those small variations. Offsets and temperature variation impact the accuracy at low power levels as well. DETECTION ERROR OVER TEMPERATURE Like any power detector device, the output signal of the LMV232 mean square power detector shows some residual variation over temperature that limits it’s dynamic range. The variation determines the accuracy and range of input power levels for which the detector produces an accurate output signal. The error over temperature is mainly caused by the variation of the pedestal voltage. Besides this, a minimal error contri- bution leads back to the conversion gain variation of the detector. This conversion gain error is visible in the mid- power range, where the temperature error curves of Figure 3 run parallel to each other. Since the conversion gain varia- tion is acceptable, the focus will be on the pedestal voltage variation over temperature. 20127884 FIGURE 2. Detection Curve 20127869 FIGURE 3. Input referred Error vs. RF Input Power www.national.com 10 |
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