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PI74FCT574TS Scheda tecnica(PDF) 2 Page - Pericom Semiconductor Corporation |
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PI74FCT574TS Scheda tecnica(HTML) 2 Page - Pericom Semiconductor Corporation |
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2 / 9 page ![]() 2 PS2016C 10/01/04 PI74FCT374T PI74FCT574T Octal D Registers (3-State) 12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012123456789012 12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012123456789012 PinDescription Inputs Outputs Internal Function OE CP DN ON QN High-Z H L X Z NC HH X Z NC Load Register L ↑ LL H L ↑ HH L H ↑ LZ H H ↑ HZ L TruthTable(1) 1. H = High Voltage Level L = Low Voltage Level X = Don’t Care Z = High Impedance NC = No Change ↑= LOW-to-HIGH transition Pin Name Description OE Output Enable Input (Active LOW) CP Clock Pulse for the register. Enters data on LOW-to-HIGH transition D0-D7 Data Inputs O0-O7 3-State Outputs (true) O0-O7 3-State Outputs (inverted) GND Ground VCC Power Maximum Ratings (Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature ................................................................. –65°C to +150°C Ambient Temperature with Power Applied ................................. -40°C to +85°C Supply Voltage to Ground Potential (Inputs & Vcc Only) .......... –0.5V to +7.0V Supply Voltage to Ground Potential (Outputs & D/O Only) ....... –0.5V to +7.0V DC Input Voltage ......................................................................... –0.5V to +7.0V DC Output Current ................................................................................... 120 mA Power Dissipation ......................................................................................... 0.5W Note: Stresses greater than those listed under MAXI- MUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. |
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