8086-2 datasheet(14/30 Pages) INTEL

14 / 30 page

8086

ABSOLUTE MAXIMUM RATINGS

Ambient Temperature Under Bias ¿¿¿¿¿¿0

ßC to 70ßC

Storage Temperature ¿¿¿¿¿¿¿¿¿¿

b65

ßC to a150ßC

Voltage on Any Pin with

Respect to Ground¿¿¿¿¿¿¿¿¿¿¿¿¿¿

b1.0V to a7V

Power Dissipation¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿¿2.5W

NOTICE: This is a production data sheet. The specifi-

cations are subject to change without notice.

*WARNING: Stressing the device beyond the ‘‘Absolute

Maximum Ratings’’ may cause permanent damage.

These are stress ratings only. Operation beyond the

‘‘Operating Conditions’’ is not recommended and ex-

tended exposure beyond the ‘‘Operating Conditions’’

may affect device reliability.

D.C. CHARACTERISTICS (8086: TA e 0ßC to 70ßC, VCC e 5V g10%)

(8086-1: TA e 0ßC to 70ßC, VCC e 5V g5%)

(8086-2: TA e 0ßC to 70ßC, VCC e 5V g5%)

Symbol

Parameter

Min

Max

Units

Test Conditions

VIL

Input Low Voltage

b0.5

a0.8

(Note 1)

VIH

Input High Voltage

2.0

VCC a 0.5

(Notes 1, 2)

VOL

Output Low Voltage

0.45

IOL e 2.5 mA

VOH

Output High Voltage

2.4

IOH eb 400 mA

ICC

Power Supply Current: 8086

340

8086-1

360

TA e 25ßC

8086-2

350

ILI

Input Leakage Current

g10

s VIN s VCC (Note 3)

ILO

Output Leakage Current

g10

0.45V

s VOUT s VCC

VCL

Clock Input Low Voltage

b0.5

a0.6

VCH

Clock Input High Voltage

3.9

VCC a 1.0

CIN

Capacitance of Input Buffer

e 1 MHz

(All input except

AD0–AD15, RQ/GT)

CIO

Capacitance of I/O Buffer

e 1 MHz

(AD0–AD15, RQ/GT)

NOTES:

1. VIL tested with MN/MX Pin e 0V. VIH tested with MN/MX Pin e 5V. MN/MX Pin is a Strap Pin.

2. Not applicable to RQ/GT0 and RQ/GT1 (Pins 30 and 31).

3. HOLD and HLDA ILI min e 30 mA, max e 500 mA.

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