ISO6721 datasheet(23/48 Pages) TI

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9.2.3 Application Curve

9.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown

(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal

device and high voltage applied between the two sides; See Figure 9-3 for TDDB test setup. The insulation

breakdown data is collected at various high voltages switching at 60 Hz over temperature. For basic insulation,

VDE standard requires the use of TDDB projection line with failure rate of less than 1000 part per million (ppm).

For reinforced insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1

part per million (ppm).

Even though the expected minimum insulation lifetime is 20 years, at the specified working isolation voltage,

VDE basic and reinforced certifications require additional safety margin of 20% for working voltage. For basic

certification, device lifetime requires a safety margin of 30% translating to a minimum required insulation lifetime

of 26 years at a working voltage that is 20% higher than the specified value. For reinforced insulation, device

lifetime requires a safety margin of 87.5% translating to a minimum required insulation lifetime of 37.5 years at a

working voltage that is 20% higher than the specified value.

Figure 9-4 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime.

Based on the TDDB data, the intrinsic capability of the insulation is 1060 VRMS with a lifetime of 220 years in the

8-DWV package and 450 VRMS with a lifetime of >100 years in the 8D package. Other factors, such as package

size, pollution degree, material group, etc. can further limit the working voltage of the component. At the lower

working voltages, the corresponding insulation lifetime is 220 years in the 8-DWV package and much longer than

100 years in the 8-D package.

DUT

Vcc 2

Vcc 1

GND 1

GND 2

Ovenat150°C

TimeCounter

> 1 mA

Figure 9-3. Test Setup for Insulation Lifetime Measurement

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ISO6720-Q1, ISO6721-Q1

SLLSFF5A – JULY 2020 – REVISED DECEMBER 2020

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