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12 Device and Documentation Support

12.1 Device Support

12.1.1 Development Support

For development support, refer to:

• Isolated CAN Flexible Data (FD) Rate Repeater Reference Design

• Isolated 16-Channel AC Analog Input Module Reference Design Using Dual Simultaneously Sampled ADCs

• Polyphase Shunt Metrology with Isolated AFE Reference Design

• Reference Design for Power-Isolated Ultra-Compact Analog Output Module

12.2 Documentation Support

12.2.1 Related Documentation

For related documentation, see the following:

• Texas Instruments, Digital Isolator Design Guide

• Texas Instruments, How to use isolation to improve ESD, EFT and Surge immunity in industrial systems

application report

• Texas Instruments, Isolation Glossary

• Texas Instruments, Enabling high voltage signal isolation quality and reliability

• Texas Instruments, SN6501-Q1 Transformer Driver for Isolated Power Supplies data sheet

• Texas Instruments, SN65HVD231Q 3.3-V CAN Transceivers data sheet

• Texas Instruments, TPS763xx-Q1 Low-Power, 150-mA, Low-Dropout Linear Regulators data sheet

• Texas Instruments, TMS320F2803x Piccolo™ Microcontrollers data sheet

12.3 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper

right corner, click on Alert me to register and receive a weekly digest of any product information that has

changed. For change details, review the revision history included in any revised document.

12.4 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight

from the experts. Search existing answers or ask your own question to get the quick design help you need.

Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do

not necessarily reflect TI's views; see TI's Terms of Use.

12.5 Trademarks

Piccolo™ is a trademark of Texas Instruments.

TI E2E™ is a trademark of Texas Instruments.

All trademarks are the property of their respective owners.

12.6 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled

with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

12.7 Glossary

TI Glossary

This glossary lists and explains terms, acronyms, and definitions.

ISO6720-Q1, ISO6721-Q1

SLLSFF5A – JULY 2020 – REVISED DECEMBER 2020

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