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TMS320F28375DPZP Scheda tecnica(PDF) 114 Page - Texas Instruments |
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TMS320F28375DPZP Scheda tecnica(HTML) 114 Page - Texas Instruments |
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114 / 226 page ![]() 8.10.1.3 Temperature Sensor Electrical Data and Timing The temperature sensor can be used to measure the device junction temperature. The temperature sensor is sampled through an internal connection to the ADC and translated into a temperature through TI-provided software. When sampling the temperature sensor, the ADC must meet the acquisition time in Section 8.10.1.3.1. 8.10.1.3.1 Temperature Sensor Electrical Characteristics over recommended operating conditions (unless otherwise noted) PARAMETER MIN TYP MAX UNIT Temperature accuracy ±15 °C Start-up time (TSNSCTL[ENABLE] to sampling temperature sensor) 500 µs ADC acquisition time 700 ns TMS320F28379D, TMS320F28379D-Q1, TMS320F28378D, TMS320F28377D TMS320F28377D-Q1, TMS320F28376D, TMS320F28375D, TMS320F28374D SPRS880O – DECEMBER 2013 – REVISED FEBRUARY 2021 www.ti.com 114 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: TMS320F28379D TMS320F28379D-Q1 TMS320F28378D TMS320F28377D TMS320F28377D-Q1 TMS320F28376D TMS320F28375D TMS320F28374D |
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