MC12009 MC12011 MC12013

5

MOTOROLA RF/IF DEVICE DATA

TEST VOLTAGE/CURRENT VALUES

Volts

mA

@ Test Temperature

VIHT

VILT

VEE

IL

IOL

IOH

–30

°C

–3.2

–4.4

–5.2

–0.25

16

–0.40

+25

°C

–3.2

–4.4

–5.2

–0.25

16

–0.40

+85

°C

–3.2

–4.4

–5.2

–0.25

16

–0.40

Pin

Under

TEST VOLTAGE APPLIED TO PINS LISTED BELOW

Gd

Characteristic

Symbol

Under

Test

VIHT

VILT

VEE

IL

IOL

IOH

Gnd

Power Supply Drain Current

ICC1

8

8

1,16

ICC2

6

8

6

Input Current

IinH1

15

11

12

13

9,10

9,10

9,10

8

8

8

8

1,16

1,16

1,16

1,16

IinH2

4

5

8

8

6

6

IinH3

5

8

6

IinH4

9

10

8

8

1,16

1,16

Leakage Current

IinL1

15

11

12

13

8,15

8,11

8,12

8,13

1,16

1,16

1,16

1,16

IinL2

9

10

8

8

1,16

1,16

Reference Voltage

VBB

14

8

14

1,16

Logic ‘1’ Output Voltage

VOH1

(Note 1.)

2

3

8

8

1,16

1,16

VOH2

7

8

7

6

Logic ‘0’ Output Voltage

VOL1

(Note 1.)

2

3

8

8

1,16

1,16

VOL2

7

8

7

6

Logic ‘1’ Threshold Voltage

VOHA

(Note 2.)

2

3

9,10

9,10

8

8

1,16

1,16

Logic ‘0’ Threshold Voltage

VOLA

(Note 3.)

2

3

9,10

9,10

8

8

1,16

1,16

Short Circuit Current

IOS

7

8

6

1. Test outputs of the device must be tested by sequencing through the truth table. All input, power supply and

ground voltages must be maintained between tests. The clock input is the waveform shown.

2. In addition to meeting the output levels specified, the device must divide by 5, 8 or 10 during this test. The clock

input is the waveform shown.

3. In addition to meeting the output levels specified, the device must divide by 6, 9 or 11 during this test. The clock

input is the waveform shown.

VIHmax

VILmin

Clock Input