TC7106A datasheet(4/32 Pages) MICROCHIP

4 / 32 page

TC7106/A/TC7107/A

DS21455C-page 4

1.0

ELECTRICAL

CHARACTERISTICS

Absolute Maximum Ratings*

TC7106A

Supply Voltage (V+ to V-) .......................................15V

Analog Input Voltage (either Input) (Note 1) ... V+ to V-

Reference Input Voltage (either Input) ............ V+ to V-

Clock Input ................................................... Test to V+

Package Power Dissipation (TA ≤ 70°C) (Note 2):

40-Pin CERDIP .......................................2.29W

40-Pin PDIP ............................................1.23W

44-Pin PLCC ...........................................1.23W

44-Pin PQFP ...........................................1.00W

Operating Temperature Range:

C (Commercial) Devices .............. 0°C to +70°C

I (Industrial) Devices ................ -25°C to +85°C

Storage Temperature Range ..............-65°C to +150°C

TC7107A

Supply Voltage (V+) ...............................................+6V

Supply Voltage (V-)..................................................-9V

Analog Input Voltage (either Input) (Note 1) ... V+ to V-

Reference Input Voltage (either Input) ............ V+ to V-

Clock Input ..................................................GND to V+

Package Power Dissipation (TA ≤ 70°C) (Note 2):

40-Pin CERDip ........................................2.29W

40-Pin PDIP ............................................1.23W

44-Pin PLCC ...........................................1.23W

44-Pin PQFP ...........................................1.00W

Operating Temperature Range:

C (Commercial) Devices .............. 0°C to +70°C

I (Industrial) Devices ................ -25°C to +85°C

Storage Temperature Range ..............-65°C to +150°C

*Stresses

above

those

listed

under

“Absolute

Maximum Ratings” may cause permanent damage to

the device. These are stress ratings only and functional

operation of the device at these or any other conditions

above those indicated in the operation sections of the

specifications is not implied. Exposure to Absolute

Maximum Rating conditions for extended periods may

affect device reliability.

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