Circuit Note

CN-0584

analog.com

Circuits from the Lab™ circuits from Analog Devices have been designed and built by Analog Devices

engineers. Standard engineering practices have been employed in the design and construction of each circuit,

and their function and performance have been tested and verified in a lab environment at room temperature.

However, you are solely responsible for testing the circuit and determining its suitability and applicability for

your use and application. Accordingly, in no event shall Analog Devices be liable for direct, indirect, special,

incidental, consequential or punitive damages due to any cause whatsoever connected to the use of any

Circuits from the Lab circuits. (Continued on last page)

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Circuits from the Lab

® reference designs are engi-

neered and tested for quick and easy system inte-

gration to help solve today’s analog, mixed-signal,

and RF design challenges. For more information

and/or support, visit www.analog.com/CN0584.

Devices Connected/Referenced

ADAQ23876

16-Bit, 15 MSPS, μModule Data Acquisition Solution

AD3552R

Dual Channel, 16-Bit, 33 MUPS, Multispan, Multi-IO SPI DAC

ADG5421F

±60 V Fault Protection and Detection,11 Ω RON, Dual SPST Switch

ADA4898-1

High Voltage, Low Noise, Low Distortion, Unity-Gain Stable, High

Speed Op Amp

Precision Low Latency Development Kit

EVALUATION AND DESIGN SUPPORT

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Circuit Evaluation Boards

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CN0584 Circuit Evaluation Board (EVAL-CN0584-EBZ)

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CN0585 Circuit Evaluation Board (EVAL-CN0585-FMCZ)

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Design and Integration Files

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Schematics, Layout Files, Bill of Materials, Software

CIRCUIT FUNCTIONS AND BENEFITS

As modern electronic, electromechanical, and electro-optical sys-

tems continue to shrink in size, require faster response times, and

have more stringent accuracy requirements, performance of the

data acquisition and hardware-in-the-loop (HIL) systems required to

simulate, develop, and test these systems must keep pace. This

is particularly true for applications requiring high power elements,

such as the testing of motor controllers, linear actuators, generator

controllers, electric vehicle chargers, or power grid elements for

the automotive and energy industries. The increasing complexity of

these modeled components leads to increased computation times,

demanding faster solutions for signal acquisition and generation.

The circuit shown in Figure 1 is a complete precision low latency

development kit, with 200 ns latency, and high-accuracy input

bandwidth. This solution enables real-time HIL simulations and de-

velopment of complex systems, significantly easing the design and

testing of digital or mixed signal control loops. It is consists of four

16-bit analog-to-digital converter (ADC) channels and four 16-bit

digital-to-analog converter (DAC) channels that allow synchronous

acquisition of analog inputs and generation of output waveforms at

15 MSPS.

The development kit provides up to 5 MHz analog input bandwidth

with extended analog and digital connectivity to simplify analog

front end (AFE) design. Both the analog input range and output are

hardware-selectable with five bipolar input ranges from ±1.5 V to

±10 V, and five output ranges from 5 V unipolar to ±10 V bipolar.

The software interface is available through the Linux industrial

input/output (IIO) framework, providing a host of debug and devel-

opment utilities and cross platform application support through

Python, MATLAB®, C, C#, and other languages. The project inte-

grates with Simulink®, where real-time models can be generated

and loaded into the field programmable gate array (FPGA) board

for testing with external hardware.

Figure 1. Simplified Block Diagram