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ADS5520IPAP Scheda tecnica(PDF) 7 Page - Texas Instruments

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Il numero della parte ADS5520IPAP
Spiegazioni elettronici  12-Bit, 125 MSPS Analog-To-Digital Converter
PDF  38 Pages
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Produttore elettronici  TI1 [Texas Instruments]
Homepage  http://www.ti.com
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ADS5520IPAP Scheda tecnica(HTML) 7 Page - Texas Instruments

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TIMING CHARACTERISTICS
(1) (2)
ADS5520
www.ti.com....................................................................................................................................................... SBAS310F – MAY 2004 – REVISED OCTOBER 2008
Typical values given at TA = 25°C, min and max specified over the full recommended operating temperature range, AVDD =
DRVDD = 3.3 V, sampling rate = 125 MSPS, 50% clock duty cycle, 3-VPP differential clock, and CLOAD = 10 pF, unless
otherwise noted
PARAMETER
DESCRIPTION
MIN
TYP
MAX
UNIT
Switching Specification
Aperture delay, tA
Input CLK falling edge to data sampling point
1
ns
Aperture jitter (uncertainty)
Uncertainty in sampling instant
300
fs
Data setup time, tSU
Data valid(3) to 50% of CLKOUT rising edge
2.3
2.7
ns
Data hold time, tH
50% of CLKOUT rising edge to data becoming
1.7
2
ns
invalid(3)
Input clock to output data valid start,
Input clock rising edge to data valid start delay
2
2.6
ns
tSTART
(4) (5)
Input clock to output data valid end,
Input clock rising edge to data valid end delay
5.8
6.9
ns
tEND
(4) (5)
Output clock jitter, tJIT
Uncertainty in CLKOUT rising edge, peak-to-peak
150
210
psPP
Output clock rise time, tr
Rise time of CLKOUT from 20% to 80% of DRVDD
1.7
1.9
ns
Output clock fall time, tf
Fall time of CLKOUT from 80% to 20% of DRVDD
1.5
1.7
ns
Input clock to output clock delay, tPDI
Input clock rising edge, zero crossing, to output
4.2
4.8
5.5
ns
clock rising edge 50%
Data rise time, tr
Data rise time measured from 20% to 80% of
3.6
4.6
ns
DRVDD
Data fall time, tf
Data fall time measured from 80% to 20% of
2.8
3.7
ns
DRVDD
Output enable(OE) to data output delay
Time required for outputs to have stable timings
1000
Clock
with regard to input clock(6) after OE is activated
cycles
Time to valid data after coming out of software
1000
power down
Clock
Wake-up time
cycles
Time to valid data after stopping and restarting the
1000
clock
Latency
Time for a sample to propagate to the ADC outputs
17.5
Clock
cycles
(1)
Timing parameters are ensured by design and characterization, and not tested in production.
(2)
See Table 6 through Table 9 in the Application Information section for timing information at additional sampling frequencies.
(3)
Data valid refers to 2 V for LOGIC HIGH and 0.8 V for LOGIC LOW.
(4)
See the Output Information section for details on using the input clock for data capture.
(5)
These specifications apply when the CLKOUT polarity is set to rising edge (according to Table 3). Add 1/2 clock period for the valid
number for a falling edge CLKOUT polarity.
(6)
Data outputs are available within a clock from assertion of OE; however, it takes 1000 clock cycles to ensure stable timing with respect
to input clock.
Copyright © 2004–2008, Texas Instruments Incorporated
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