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LPV521 Scheda tecnica(PDF) 6 Page - Texas Instruments |
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LPV521 Scheda tecnica(HTML) 6 Page - Texas Instruments |
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6 / 29 page ![]() LPV521 SNOSB14C – AUGUST 2009 – REVISED FEBRUARY 2013 www.ti.com 5V DC Electrical Characteristics (1) (continued) Unless otherwise specified, all limits guaranteed for TA = 25°C, V + = 5V, V− = 0V, V CM = VO = V +/2, and R L > 1MΩ. Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min Typ Max Units (2) (3) (2) TCVOS Input Offset Voltage Drift(4) ±0.4 ±3.5 μV/°C IBIAS Input Bias Current 0.04 ±1 pA ±50 IOS Input Offset Current 60 fA CMRR Common Mode Rejection Ratio 0V ≤ VCM ≤ 5.0V 75 102 74 0V ≤ VCM ≤ 3.9V 84 108 dB 80 4.4V ≤ VCM ≤ 5.0V 77 115 76 PSRR Power Supply Rejection Ratio 1.6V ≤ V+ ≤ 5.5V 85 109 dB VCM = 0.3V 76 CMVR Common Mode Voltage Range CMRR ≥ 75 dB −0.1 5.1 V CMRR ≥ 74 dB 0 5 AVOL Large Signal Voltage Gain VO = 0.5V to 4.5V 84 132 dB RL = 100 kΩ to V +/2 76 VO Output Swing High RL = 100 kΩ to V +/2 3 50 VIN(diff) = 100 mV 50 mV from either rail Output Swing Low RL = 100 kΩ to V +/2 3 50 VIN (diff) = −100 mV 50 IO Output Current(5) Sourcing, VO to V − 15 23 VIN(diff) = 100 mV 8 mA Sinking, VO to V + 15 22 VIN(diff) = −100 mV 8 IS Supply Current VCM = 0.3V 351 400 620 nA VCM = 4.7V 475 600 870 (4) The offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change. (5) The short circuit test is a momentary open loop test. 5V AC Electrical Characteristics (1) Unless otherwise specified, all limits guaranteed for TA = 25°C, V + = 5V, V− = 0V, V CM = VO = V +/2, and R L > 1MΩ. Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min Typ Max Units (2) (3) (2) GBW Gain-Bandwidth Product CL = 20 pF, RL = 100 kΩ 6.2 kHz SR Slew Rate AV = +1, Falling Edge 1.1 2.7 VIN = 0V to 5V 1.2 V/ms Rising Edge 1.1 2.4 1.2 θ m Phase Margin CL = 20 pF, RL = 100 kΩ 73 deg Gm Gain Margin CL = 20 pF, RL = 100 kΩ 20 dB (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) All limits are guaranteed by testing, statistical analysis or design. (3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material. 6 Submit Documentation Feedback Copyright © 2009–2013, Texas Instruments Incorporated Product Folder Links: LPV521 |
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