AN3181 datasheet(24/31 Pages) STMICROELECTRONICS

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AN3181 Scheda tecnica(PDF) 24 Page - STMicroelectronics

Il numero della parte	AN3181

Spiegazioni elettronici	Guidelines for obtaining IEC 60335 Class B certification in an STM8 application

PDF	31 Pages

Scroll/Zoom	100%

Produttore elettronici	STMICROELECTRONICS [STMicroelectronics]

Homepage	http://www.st.com

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24 / 31 page

Class B solution structure

AN3181

24/31

Doc ID 17286 Rev 2

Figure 12.

Periodic run mode self test and time base interrupt service structure

4.4.2

CPU light run mode self test

CPU core run mode self test is a simplified startup test where the flags and stack pointer are

not tested. In case of error, FailSafe() routine is called.

Figure 13.

CPU light run mode self test structure

4.4.3

Stack boundaries run mode test

The magic pattern stored at the top of the stack is checked here. In case the original pattern

is corrupted, FailSafe() routine is called. The pattern is placed at the lowest address

dedicated for stack area.Overflow and underflow are detected as the stack pointer rolls over

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