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Motore di ricerca datesheet componenti elettronici |
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Motore di ricerca datesheet componenti elettronici |
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AN3181 Scheda tecnica(PDF) 25 Page - STMicroelectronics |
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AN3181 Scheda tecnica(HTML) 25 Page - STMicroelectronics |
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25 / 31 page  AN3181 Class B solution structure Doc ID 17286 Rev 2 25/31 inside this range in both cases. This area differs among the devices. The user must respect the dedicated stack area when the pattern location is changed. Figure 14. Stack overflow run mode test structure 4.4.4 Clock run mode self test The current master clock frequency selected by user application is gated by LSI internal clock source. The resulting number of pulses is compared with the initial master frequency reference sample measure which was stored during initial run mode self tests. When there is more than +/-25% difference found, FailSafe() routine is called. Occasional over captured measure is ignored. It can appear when a longer user interrupt service corrupts current measurement. Figure 15. Clock run mode self test structure |
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