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TSB611ILT Scheda tecnica(PDF) 18 Page - STMicroelectronics |
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TSB611ILT Scheda tecnica(HTML) 18 Page - STMicroelectronics |
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18 / 24 page ![]() Application information TSB611 18/24 DocID028074 Rev 1 The long term drift parameter (ΔV io), estimating the reliability performance of the product, is obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the calculated number of months (Equation 7). Equation 7 Where Vio drift is the measured drift value in the specified test conditions after 1000 h stress duration. 3.6 ESD structure of TSB611 The TSB611 is protected against electrostatic discharge (ESD) with dedicated diodes (see Figure 35). These diodes must be considered at application level especially when signals applied on the input pins go beyond the power supply rails (VCC+ or VCC-). Current through the diodes must be limited to a maximum of 10 mA as stated in Table 1. A serial resistor or a Schottky diode can be used on the inputs to improve protection but the 10 mA limit of input current must be strictly observed. Figure 35: ESD structure ∆V io V iodr ift month s = TSB611 + - |
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