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SPC56EL54x Scheda tecnica(PDF) 126 Page - STMicroelectronics |
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SPC56EL54x Scheda tecnica(HTML) 126 Page - STMicroelectronics |
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126 / 165 page ![]() Electrical characteristics SPC56ELx, SPC564Lx 126/165 DocID15457 Rev 12 2. Initial Max program and erase times provide guidance for time-out limits used in the factory and apply for <100 program/erase cycles, nominal supply values and operation at 25°C. These values are verified at production test. 3. Lifetime Max program and erase times apply across the voltage, temperature, and cycling range of product life. These values are characterized, but not tested. 4. Program times are actual hardware programming times and do not include software overhead. Table 29. Flash memory timing Symbol Parameter Value Unit Min Typ Max TRES D Time from clearing the MCR-ESUS or PSUS bit with EHV = 1 until DONE goes low —— 100 ns TDONE D Time from 0 to 1 transition on the MCR-EHV bit initiating a program/erase until the MCR-DONE bit is cleared —— 5 ns TPSRT D Time between program suspend resume and the next program suspend request.(1) 100 — — µs TESRT D Time between erase suspend resume and the next erase suspend request.(2) 10 ms 1. Repeated suspends at a high frequency may result in the operation timing out, and the flash module will respond by completing the operation with a fail code (MCR[PEG] = 0), or the operation not able to finish (MCR[DONE] = 1 during Program operation). The minimum time between suspends to ensure this does not occur is TPSRT. 2. If Erase suspend rate is less than TESRT, an increase of slope voltage ramp occurs during erase pulse. This improves erase time but reduces cycling figure due to overstress. Table 30. Flash memory module life No. Symbol Parameter Value Unit Minimum Typical Maximum 1P/E C Number of program/erase cycles per block for 16 KB, 48 KB, and 64 KB blocks over the operating temperature range(1) 100000 — — cycles 2P/E C Number of program/erase cycles per block for 128 KB and 256 KB blocks over the operating temperature range(1) 1000 100000 (2) — cycles 3 Retenti on C Minimum data retention at 85 °C average ambient temperature(3) Blocks with 0–1,000 P/E cycles Blocks with 1,001–10,000 P/E cycles Blocks with 10,001–100,000 P/E cycles 20 10 5 — — — — — — years 1. Operating temperature range is TJ from –40 °C to 150 °C. Typical endurance is evaluated at 25 C. 2. Typical P/E cycles is 100,000 cycles for 128 KB and 256 KB blocks. 3. Ambient temperature averaged over duration of application, not to exceed product operating temperature range. |
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