DAC7553 datasheet(2/20 Pages) TI

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ABSOLUTE MAXIMUM RATINGS

DAC7553

SLAS477 – AUGUST 2005

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

ORDERING INFORMATION(1)

SPECIFIED

PACKAGE

ORDERING

TRANSPORT

PRODUCT

PACKAGE

TEMPERATURE

DESIGNATOR

MARKING

NUMBER

MEDIA

RANGE

DAC7553IRGTT

250-piece Tape and Reel

DAC7553

16 QFN

RGT

–40°C TO 105°C

D753

DAC7553IRGTR

2500-piece Tape and Reel

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

Web site at www.ti.com.

over operating free-air temperature range (unless otherwise noted)(1)

UNIT

VDD to GND

–0.3 V to 6 V

Digital input voltage to GND

–0.3 V to VDD + 0.3 V

Vout to GND

–0.3 V to VDD+ 0.3 V

Operating temperature range

–40°C to 105°C

Storage temperature range

–65°C to 150°C

Junction temperature (TJ Max)

150°C

(1)

Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

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