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ICE40LP Scheda tecnica(PDF) 30 Page - Lattice Semiconductor |
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ICE40LP Scheda tecnica(HTML) 30 Page - Lattice Semiconductor |
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30 / 52 page ![]() iCE40 LP/HX Family Data Sheet © 2011-2018 Lattice Semiconductor Corp. All Lattice trademarks, registered trademarks, patents, and disclaimers are as listed at www.latticesemi.com/legal. All other brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice. 30 FPGA-DS-02029-3.5 4.22. Timing Adders Over recommended operating conditions. Table 4.23. Timing Adders – LP Devices* Input Adjusters LVDS25 LVDS, VCCIO = 2.5 V –0.18 ns subLVDS subLVDS, VCCIO = 1.8 V 0.82 ns LVCMOS33 LVCMOS, VCCIO = 3.3 V 0.18 ns LVCMOS25 LVCMOS, VCCIO = 2.5 V 0.00 ns LVCMOS18 LVCMOS, VCCIO = 1.8 V 0.19 ns Output Adjusters LVDS25E LVDS, Emulated, VCCIO = 2.5 V 0.00 ns subLVDSE subLVDS, Emulated, VCCIO = 1.8 V 1.32 ns LVCMOS33 LVCMOS, VCCIO = 3.3 V –0.12 ns LVCMOS25 LVCMOS, VCCIO = 2.5 V 0.00 ns LVCMOS18 LVCMOS, VCCIO = 1.8 V 1.32 ns *Notes: Timing adders are relative to LVCMOS25 and characterized but not tested on every device. LVCMOS timing measured with the load specified in the Switching Test Condition table. All other standards tested according to the appropriate specifications. Commercial timing numbers are shown. Not all I/O standards are supported for all banks. See the Architecture section of this data sheet for details. Over recommended operating conditions. Table 4.24. Timing Adders – HX Devices* Input Adjusters LVDS25 LVDS, VCCIO = 2.5 V 0.13 ns subLVDS subLVDS, VCCIO = 1.8 V 1.03 ns LVCMOS33 LVCMOS, VCCIO = 3.3 V 0.16 ns LVCMOS25 LVCMOS, VCCIO = 2.5 V 0.00 ns LVCMOS18 LVCMOS, VCCIO = 1.8 V 0.23 ns Output Adjusters LVDS25E LVDS, Emulated, VCCIO = 2.5 V 0.00 ns subLVDSE subLVDS, Emulated, VCCIO = 1.8 V 1.76 ns LVCMOS33 LVCMOS, VCCIO = 3.3 V 0.17 ns LVCMOS25 LVCMOS, VCCIO = 2.5 V 0.00 ns LVCMOS18 LVCMOS, VCCIO = 1.8 V 1.76 ns *Notes: Timing adders are relative to LVCMOS25 and characterized but not tested on every device. LVCMOS timing measured with the load specified in the Switching Test Condition table. All other standards tested according to the appropriate specifications. Commercial timing numbers are shown. Not all I/O standards are supported for all banks. See the Architecture section of this data sheet for details. |
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