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Motore di ricerca datesheet componenti elettronici |
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Motore di ricerca datesheet componenti elettronici |
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L9961-TR Scheda tecnica(PDF) 16 Page - STMicroelectronics |
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L9961-TR Scheda tecnica(HTML) 16 Page - STMicroelectronics |
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16 / 65 page  Table 10. Cell voltage monitor diagnostics Fault type Assertion condition IC reaction to assertion Release condition IC reaction to flag clear Maskable Cell UV If a cell voltage falls below VCELL_UV_TH, the corresponding UV counter is incremented by 1 The CELL<x>_UV flag is set If a cell voltage raises above VCELL_UV_TH, the corresponding UV counter is decremented by 1. The discharge FET is restored to the status defined by the DCHG_ON bit VCELL<x>_EN masks measurement execution. The UV flag of a disabled cell can always be cleared If the UV counter reaches VCELL_UV_CNT_TH, it saturates and the cell UV fault is acknowledged. The discharge FET is turned OFF If the UV counter reaches zero, the cell UV flag can be cleared by MCU FAULTN line is released CELL_UV_PRDRV_MS K masks reaction on DCHG pin FAULTN line is asserted CELL_UV_FAULTN_MS K masks reaction on FAULTN pin Cell severe UV If a cell voltage falls below VCELL_SEVERE_UV_T H, the severe UV fault is acknowledged The CELL<x>_SEVERE_UV flag is set If a cell voltage raises above VCELL_SEVERE_UV_T H, the cell severe UV flag can be cleared by MCU The discharge FET is restored to the status defined by the DCHG_ON bit VCELL<x>_EN masks measurement execution. The severe UV flag of a disabled cell can always be cleared The discharge FET is turned OFF FUSE pre-driver is disabled CELL_SEVERE_UV_P RDRV_MSK masks reaction on DCHG pin FUSE pre-driver is enabled FAULTN line is released CELL_SEVERE_UV_F USE_MSK masks reaction on FUSE pin FAULTN line is asserted CELL_SEVERE_UV_FA ULTN_MSK masks reaction on FAULTN pin Cell OV If a cell voltage raises above VCELL_OV_TH, the corresponding OV counter is incremented by 1 The CELL<x>_OV flag is set If a cell voltage falls below VCELL_OV_TH, the corresponding OV counter is decremented by 1. The charge FET is restored to the status defined by the CHG_ON bit VCELL<x>_EN masks measurement execution. The OV flag of a disabled cell can always be cleared If the OV counter reaches VCELL_OV_CNT_TH, it saturates and the cell OV fault is acknowledged. The charge FET is turned OFF If the OV counter reaches zero, the cell OV flag can be cleared by MCU FAULTN line is released CELL_OV_PRDRV_MS K masks reaction on CHG pin FAULTN_SAFE is pulled low for TFAULTN_SAFE_LOW (if a pulse on FAULTN_SAFE pin was not already generated after a previous not masked and not cleared Cell OV / Cell Severe OV detection) CELL_OV_RST_MSK masks reaction FAULTN_SAFE pin FAULTN line is asserted CELL_OV_FAULTN_MS K masks reaction on FAULTN pin Cell severe OV If a cell voltage raises above VCELL_SEVERE_OV_ TH, the severe OV fault is acknowledged The CELL<x>_SEVERE_OV flag is set If a cell voltage falls below VCELL_SEVERE_OV_ TH, the cell severe OV flag can be cleared by MCU The charge FET is restored to the status defined by the CHG_ON bit VCELL<x>_EN masks measurement execution. The severe OV flag of a disabled cell can always be cleared The charge FET is turned OFF FUSE pre-driver is disabled CELL_SEVERE_OV_P RDRV_MSK masks reaction on CHG pin L9961 Voltage conversion routine DS14012 - Rev 3 page 16/65 |
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