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L9961-TR Scheda tecnica(PDF) 27 Page - STMicroelectronics |
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L9961-TR Scheda tecnica(HTML) 27 Page - STMicroelectronics |
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27 / 65 page ![]() Symbol Parameter Test conditions Min. Typ. Max. Unit TCUR_FILTER Programmable current Sense sample acquisition time (2 bit) TCURFILTER =528us*23+CODE Tested by SCAN 4.22 33.79 ms NBIT_CSA ADC bit number: encoding is in 2’s complement Design info 16 bit VCUR_RES CSA resolution Design info VDIFF_RANGE_E XT /2 NBIT_CSA-1 mV ICSA_LEAK ISENSEP, ISENSEM input leakage differential current ISENSEP, ISENSEM in [0-3.3] V range 190 nA RCSA_IN_DIFF ISENSEP, ISENSEM differential input impedance ISENSEP-ISENSEM falls within VDIFF_RANGE Guaranteed by design 400 kΩ CSAGAIN_ERR_CAL ADC post-calibration gain error Post-soldering After customer EOL calibration using a single point TAMB = 25 °C 2.6 mV < | ISENSEP- ISENSEM | < VDIFF_RANGE -0.1 0.1 % CSAGAIN_ERR ADC native gain error Post-soldering TAMB = 25 °C 2.6 mV < | ISENSEP- ISENSEM | < VDIFF_RANGE 0.5 0.5 % CSAGAIN_ERR_THERM_DRI FT Gain error thermal drift Guaranteed by characterization ISENSEP-ISENSEM falls within VDIFF_RANGE -1 +1 LSB/°C CSAOFFSET_ERR ADC native offset error Long term average over 100 samples using Coulomb counter TAMB = 25 °C -1 1 LSB CSALOW_RANGE_ERR Total conversion error in low range, including post-soldering, ageing effects and INL 0 mV < | ISENSEP- ISENSEM | ≤ 2.6 mV Guaranteed by test bench characterization TAMB = 25 °C -2 +2 LSB CSAOFFSET_ERR_THERM_ DRIFT Offset error thermal drift Guaranteed by characterization -0.007 0.007 LSB/°C VCSA_NOISE +/- 3σ distribution over 100 samples Guaranteed by characterization -7 7 LSB CSAINL_ERR ADC integral non linearity error Guaranteed by characterization -8 8 LSB L9961 Current conversion routine DS14012 - Rev 3 page 27/65 |
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