MBM29F080A datasheet(24/44 Pages) SPANSION

24 / 44 page

MBM29F080A-55/-70/-90

s AC CHARACTERISTICS

•

Read Only Operations Characteristics

*1 : Test Conditions:

Output Load: 1 TTL gate and 30 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.0 V or 3.0 V

Timing measurement reference level

Input: 1.5 V

Output: 1.5 V

Parameter

Symbol

Test

Setup

-55 *1

-70 *2

-90 *2

Unit

JEDEC Standard

Min Max Min Max

Min

Max

Read Cycle Time

tAVAV

tRC

—

Address to Output Delay

tAVQV

tACC

CE = VIL

OE = VIL

—55—70

—

Chip Enable to Output Delay

tELQV

tCE

OE = VIL

—55—70

—

Output Enable to Output Delay

tGLQV

tOE

—

Chip Enable to Output HIGH-Z

tEHQZ

tDF

—

Output Enable to Output HIGH-Z

tGHQZ

tDF

—

Output Hold Time From Addresses,

CE or OE, Whichever Occurs First

tAXQX

tOH

—0

—

RESET Pin Low to Read Mode

—

tREADY

—

µs

Test Conditions

Notes :

• MBM29F080A-55: CL = 30 pF including jig capacitance

• MBM29F080A-70/-90: CL = 100 pF including jig capacitance

5.0 V

Diode=1N3064

or Equivalent

2.7 k

Ω

Device

Under

Test

Diode=1N3064

or Equivalent

6.2 k

Ω

*2 : Test Conditions:

Output Load: 1 TTL gate and 100 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.45 V or 2.4 V

Timing measurement reference level

Input: 0.8 V and 2.0 V

Output: 0.8 V and 2.0 V

MBM29F080A Scheda tecnica(PDF) 24 Page - SPANSION

MBM29F080A Scheda tecnica(HTML) 24 Page - SPANSION

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44

Scheda tecnica Scarica

Link URL