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PIC16F628AESS Scheda tecnica(PDF) 143 Page - Microchip Technology

Il numero della parte PIC16F628AESS
Spiegazioni elettronici  Flash-Based, 8-Bit CMOS Microcontrollers with nanoWatt Technology
PDF  180 Pages
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Produttore elettronici  MICROCHIP [Microchip Technology]
Homepage  http://www.microchip.com
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PIC16F628AESS Scheda tecnica(HTML) 143 Page - Microchip Technology

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© 2005 Microchip Technology Inc.
DS40044D-page 141
PIC16F627A/628A/648A
TABLE 17-1:
DC Characteristics: PIC16F627A/628A/648A (Industrial, Extended)
PIC16LF627A/628A/648A (Industrial)
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C
≤ TA ≤ +85°C for industrial and
-40°C
≤ TA ≤ +125°C for extended
Operating voltage VDD range as described in DC specification
Table 17-2 and Table 17-3
Parameter
No.
Sym
Characteristic
Min
Typ†
Max
Units
Conditions
Data EEPROM Memory
D120
D120A
D121
D122
D123
D124
ED
ED
VDRW
TDEW
TRETD
TREF
Endurance
Endurance
VDD for read/write
Erase/Write cycle time
Characteristic Retention
Number of Total Erase/Write
Cycles before Refresh(1)
100K
10K
VMIN
—
40
1M
1M
100K
—
4
—
10M
—
5.5
8*
—
—
E/W
E/W
V
ms
Year
E/W
-40
°C ≤ TA ≤ 85°C
85°C
≤ TA ≤ 125°C
VMIN = Minimum operating
voltage
Provided no other
specifications are violated
-40
°C to +85°C
Program Flash Memory
D130
D130A
D131
D132
D132A
D133
D133A
D134
EP
EP
VPR
VIE
VPEW
TIE
TPEW
TRETP
Endurance
Endurance
VDD for read
VDD for Block erase
VDD for write
Block Erase cycle time
Write cycle time
Characteristic Retention
10K
1000
VMIN
4.5
VMIN
—
—
40
100K
10K
—
—
—
4
2
—
—
—
5.5
5.5
5.5
8*
4*
—
E/W
E/W
V
V
V
ms
ms
year
-40
°C ≤ TA ≤ 85°C
85°C
≤ TA ≤ 125°C
VMIN = Minimum operating
voltage
VMIN = Minimum operating
voltage
VDD > 4.5V
Provided no other
specifications are violated
*
These parameters are characterized but not tested.
†
Data in “Typ” column is at 5.0V, 25
°C unless otherwise stated. These parameters are for design guidance
only and are not tested.
Note 1:
Refer to Section 13.7 “Using the Data EEPROM” for a more detailed discussion on data EEPROM
endurance.



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