TSC2004 datasheet(3/62 Pages) TI2

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ELECTRICAL CHARACTERISTICS

TSC2004

SBAS408E – JUNE 2007 – REVISED MARCH 2008

At TA = –40°C to +85°C, SNSVDD = VREF = +1.2V to +3.6V, I/OVDD

(1) = +1.2V to +3.6V, unless otherwise noted.

TSC2004

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

AUXILIARY ANALOG INPUT

Input voltage range

VREF

Input capacitance

Input leakage current

–1

µA

A/D CONVERTER

Resolution

Programmable: 10 or 12 bits

Bits

No missing codes

12-bit resolution

Bits

Integral linearity

–3

–0.8 to +1.4

LSB(2)

Differential linearity

–2

–0.6 to +0.7

LSB

TSC2004IRTJ

–5

2.2

LSB

SNSVDD = 1.6V, VREF = 1.6V,

Offset error

High-Speed mode, filter off

TSC2004IYZK

2.2

LSB

TSC2004IRTJ

–3

0.1

SNSVDD = 1.6V, VREF = 1.6V,

Gain error

LSB

High-Speed mode, filter off

TSC2004IYZK

0.1

REFERENCE INPUT

VREF range

1.2

SNSVDD

Non-continuous AUX mode, SNSVDD = VREF = 1.6V,

VREF input current drain

1.2

µA

TA = +25°C, fADC = 2MHz, High-Speed mode

Input impedance

A/D converter not converting

Ω

TOUCH SENSORS

PENIRQ 50k

Ω pull-up

TA = +25°C, SNSVDD = VREF = 1.6V

Ω

resistor, RIRQ

Y+, X+

TA = +25°C, SNSVDD = VREF = 1.6V

Ω

Switch

on-resistance

Y–, X–

TA = +25°C, SNSVDD = VREF = 1.6V

Ω

Switch drivers drive

100ms duration

current(3)

INTERNAL TEMPERATURE SENSOR

Temperature range

–40

+85

°C

SNSVDD = 1.6V

0.3

°C/LSB

Differential method(4)

SNSVDD = 3V

1.6

°C/LSB

Resolution

SNSVDD = 1.6V

0.3

°C/LSB

TEMP1(5)

SNSVDD = 3V

1.6

°C/LSB

SNSVDD = 1.6V

±3

°C/LSB

Differential method(4)

SNSVDD = 3V

±2

°C/LSB

Accuracy

SNSVDD = 1.6V

±3

°C/LSB

TEMP1(5)

SNSVDD = 3V

±2

°C/LSB

INTERNAL OSCILLATOR

SNSVDD = 1.2V, TA = +25°C

3.2

MHz

Clock frequency, fOSC

SNSVDD = 1.6V

3.3

3.7

4.3

MHz

SNSVDD = 3.0V, TA = +25°C

4.1

MHz

SNSVDD = 1.2V

0.118

°C

Frequency drift

SNSVDD = 1.6V

–0.018

°C

SNSVDD = 3.0V

–0.032

°C

(1)

I/OVDD must be

≤ SNSVDD.

(2)

LSB means Least Significant Bit. With VREF = +2.5V, one LSB is 610µV.

(3)

Assured by design, but not tested. Exceeding 50mA source current may result in device degradation.

(4)

Difference between TEMP1 and TEMP2 measurement; no calibration necessary.

(5)

Temperature drift is –2.1mV/

°C.

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