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DIO7B104LP12 Scheda tecnica(PDF) 6 Page - DIOO MICROCIRCUITS CO., LTD |
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DIO7B104LP12 Scheda tecnica(HTML) 6 Page - DIOO MICROCIRCUITS CO., LTD |
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6 / 23 page ![]() DIO7B104 Version 1.0, Jun 2024 www.dioo.com © 2024 DIOO MICROCIRCUITS CO., LTD. 3 4. ESD Ratings When a statically-charged person or object touches an electrostatic discharge sensitive device, the electrostatic charge might be drained through sensitive circuitry in the device. If the electrostatic discharge possesses sufficient energy, damage might occur to the device due to localized overheating. Model Metric Value Unit Human-body model ANSI/ESDA/JEDECJS-001 ±8000 V Charged-device model ANSI/ESDA/JEDECJS-002 ±2000 V 5. Thermal Considerations The thermal resistance determines the heat insulation property of a material. The higher the thermal resistance is, the lower the heat loss. Accumulation of heat energy degrades the performance of semiconductor components. Symbol Parameter Value Unit RθJA Junction-to-ambient thermal resistance TSSOP-14 121 °C/W QFN2.0*1.7-12 120 °C/W RθJC(top) Junction-to-case (top) thermal resistance TSSOP-14 50 °C/W QFN2.0*1.7-12 43 °C/W |
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