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AD9753ASTRL Scheda tecnica(PDF) 5 Page - Analog Devices

Il numero della parte AD9753ASTRL
Spiegazioni elettronici  12-Bit, 300 MSPS High Speed TxDAC D/A Converter
PDF  28 Pages
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Produttore elettronici  AD [Analog Devices]
Homepage  http://www.analog.com
Logo AD - Analog Devices

AD9753ASTRL Scheda tecnica(HTML) 5 Page - Analog Devices

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REV. B
AD9753
–5–
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD9753 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
PORT 1
DATA X
DATA Y
tH
tS
tLPW
tPD
DATA X
DATA Y
tPD
PORT 2
IOUTA OR IOUTB
INPUT CLK
(PLL ENABLED)
DATA IN
Figure 1. I/O Timing
ORDERING GUIDE
Temperature
Package
Package
Model
Range
Description
Option
AD9753AST
–40
°C to +85°C 48-Lead LQFP ST-48
AD9753ASTRL –40
°C to +85°C 48-Lead LQFP ST-48
AD9753-EB
Evaluation
Board
THERMAL CHARACTERISTIC
Thermal Resistance
48-Lead LQFP
JA = 91
°C/W
ABSOLUTE MAXIMUM RATINGS
*
Parameter
With Respect to
Min
Max
Unit
AVDD, DVDD, CLKVDD, PLLVDD
ACOM, DCOM, CLKCOM, PLLCOM
–0.3
+3.9
V
AVDD, DVDD, CLKVDD, PLLVDD
AVDD, DVDD, CLKVDD, PLLVDD
–3.9
+3.9
V
ACOM, DCOM, CLKCOM, PLLCOM
ACOM, DCOM, CLKCOM, PLLCOM
–0.3
+0.3
V
REFIO, REFLO, FSADJ
ACOM
–0.3
AVDD + 0.3
V
IOUTA, IOUTB
ACOM
–1.0
AVDD + 0.3
V
Digital Data Inputs (DB13 to DB0)
DCOM
–0.3
DVDD + 0.3
V
CLK+/CLK–, PLLLOCK
CLKCOM
–0.3
CLKVDD + 0.3
V
DIV0, DIV1, RESET
CLKCOM
–0.3
CLKVDD + 0.3
V
LPF
PLLCOM
–0.3
PLLVDD + 0.3
V
Junction Temperature
150
°C
Storage Temperature
–65
+150
°C
Lead Temperature (10 sec)
300
°C
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device
at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum ratings for extended
periods may affect device reliability.



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