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AN3307 Scheda tecnica(PDF) 11 Page - STMicroelectronics |
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AN3307 Scheda tecnica(HTML) 11 Page - STMicroelectronics |
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11 / 37 page ![]() AN3307 Compliance with IEC and VDE standards Doc ID 18186 Rev 4 11/37 3.1 Generic tests included in the STM32Fxxx firmware library The certified by VDE STM32Fxxx firmware library packages are composed of the following micro-specific software modules: ● CPU register test ● Clock monitoring ● RAM functional check ● Flash checksum integrity check ● Watchdog self-test ● Stack overflow monitoring An overview of the methods used for these MCU-specific tests is given in Table 2 and they are described in more detail in the following chapters. The last two items from the list above are not explicitly asked for by the norm, but they improve overall fault coverage. Table 1. MCU parts which must be tested for Class B compliance Group Components to be tested Micro-specific CPU registers CPU program counter Clock Volatile & non-volatile memories Internal addressing (and external memory addressing if any) Internal data path Application-specific Interrupt handling External communication Timing I/O peripherals Analog A/D and D/A Analog multiplexer |
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