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PIMXRT406LCAE4A Scheda tecnica(PDF) 19 Page - NXP Semiconductors |
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PIMXRT406LCAE4A Scheda tecnica(HTML) 19 Page - NXP Semiconductors |
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19 / 100 page ![]() Electrical characteristics i.MX RT1020 Crossover Processors for Industrial Products, Rev. 2, 03/2021 NXP Semiconductors 19 4.1.2.2 14 x 14 mm package thermal resistance Table 9 displays the 14 x 14 mm LQFP package thermal resistance data. 4.1.3 Operating ranges Table 11 provides the operating ranges of the i.MX RT1020 processors. For details on the chip's power structure, see the “Power Management Unit (PMU)” chapter of the i.MX RT1020 Reference Manual (IMXRT1020RM). 6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT. Table 10. 14 x 14 mm package thermal resistance data Rating Test Conditions Symbol Value Unit Notes Junction to Ambient Natural convection Single-layer board (1s) RJA 63 oC/W 1,2 1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2 Per JEDEC JESD51-2 with natural convection for horizontally oriented board. Board meets JESD51-9 specification for 1s or 2s2p board, respectively. Junction to Ambient Natural convection Four-layer board (2s2p) RJA 52 oC/W 1,2 Junction to Ambient (@200 ft/min) Single layer board (1s) RJMA 53 oC/W 1,3 3 Per JEDEC JESD51-6 with forced convection for horizontally oriented board. Board meets JESD51-9 specification for 1s or 2s2p board, respectively. Junction to Ambient (@200 ft/min) Four layer board (2s2p) RJMA 46 oC/W 1,3 Junction to Board — RJB 36 oC/W 4 4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. Junction to Case — RJC 19 oC/W 5 5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). Junction to Package Top Natural Convection JT 3 oC/W 6 6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT. |
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