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ADC12QJ1600ALREP Scheda tecnica(PDF) 21 Page - Texas Instruments

Il numero della parte ADC12QJ1600ALREP
Spiegazioni elettronici  ADC12QJ1600-EP Quad Channel 1.6-GSPS, 12-Bit, Analog-to-Digital Converter (ADC) with JESD204C Interface
PDF  148 Pages
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Produttore elettronici  TI [Texas Instruments]
Homepage  http://www.ti.com
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ADC12QJ1600ALREP Scheda tecnica(HTML) 21 Page - Texas Instruments

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7.8 Timing Requirements
MIN
NOM
MAX
UNIT
ADC SAMPLING CLOCK
fS
ADC core sampling clock frequency
High Performance Mode
500(1)
1600(1)
MHz
Low Power Mode
1000(1)
ADC core minimum sampling clock frequency
Low Power Mode
500(1)
tS
ADC core sampling clock period
High Performance Mode
625(1)
2000(1)
ps
Low Power Mode
1000(1)
ps
ADC core maximum sampling clock period
Low Power Mode
2000(1)
ps
CLOCK INPUTS (CLK+, CLK–, SE_CLK)
fCLK
CLK± input frequency
PLL Disabled
500
1600
MHz
PLL Enabled, PLLREF_SE
= 0
50
500
fSE_CLK
SE_CLK input frequency
PLL Enabled, PLLREF_SE
= 1
50
500
MHz
DC(CLKMIN)
Minimum Input clock duty cycle (CLK± and SE_CLK)
Input clock duty cycle
(CLK± and SE_CLK)
40%
DC(CLKMAX)
Maximum Input clock duty cycle (CLK± and SE_CLK)
60%
PHASE-LOCKED LOOP (PLL) AND VOLTAGE-CONTROLLED OSCILLATOR (VCO)
fPLLPFD
PLL phase-frequency detector (PFD) frequency
PLL Enabled
50
500
MHz
fVCO
Closed-loop voltage-controlled oscillator (VCO) frequency PLL Enabled
7200
8200
MHz
SYSREF (SYSREF+, SYSREF–)
tINV(SYSREF)
Width of invalid SYSREF capture region of CLK± period, indicating setup or hold time
violation, as measured by SYSREF_POS status register(2)
250
ps
tINV(TEMP)
Drift of invalid SYSREF capture region over temperature, positive number indicates a
shift toward MSB of SYSREF_POS register
0.05
ps/°C
tINV(VA11)
Drift of invalid SYSREF capture region over VA11 supply voltage, positive number
indicates a shift toward MSB of SYSREF_POS register
-0.17
ps/mV
tSTEP(SP)
Delay of SYSREF_POS LSB
SYSREF_ZOOM = 0
125
ps
SYSREF_ZOOM = 1
69
DC(SYSREF)
SYSREF duty cycle (asserted) when using a periodic SYSREF signal
50%
55%
t(PH_SYS)
Minimum SYSREF± assertion duration after SYSREF± rising edge event
4
ns
JESD204C SYNC TIMING (SYNCSE)
SERIAL PROGRAMMING INTERFACE (SCLK, SDI, SCS)
fCLK(SCLK)
Serial clock frequency
0
15.625
MHz
t(PH)
Serial clock high value pulse duration
32
ns
t(PL)
Serial clock low value pulse duration
32
ns
tSU(SCS)
Setup time from SCS to rising edge of SCLK
25
ns
tH(SCS)
Hold time from rising edge of SCLK to SCS
3
ns
tSU(SDI)
Setup time from SDI to rising edge of SCLK
25
ns
tH(SDI)
Hold time from rising edge of SCLK to SDI
3
ns
(1)
Unless functionally limited to a smaller range in the tables Operating Modes for Quad Channel Device based on programmed JMODE.
(2)
Use SYSREF_POS to select an optimal SYSREF_SEL value for the SYSREF capture, see the section SYSREF Windowing for
more information on SYSREF windowing. The invalid region, specified by tINV(SYSREF), indicates the portion of the CLK± period(tCLK),
as measured by SYSREF_SEL, that may result in a setup and hold violation. Verify that the timing skew between SYSREF± and
CLK± over system operating conditions from the nominal conditions (that used to find optimal SYSREF_SEL) does not result in the
invalid region occurring at the selected SYSREF_SEL position in SYSREF_POS, otherwise a temperature dependent SYSREF_SEL
selection may be needed to track the skew between CLK± and SYSREF±.
www.ti.com
ADC12QJ1600-EP
SBASAJ4A – JUNE 2022 – REVISED DECEMBER 2022
Copyright © 2022 Texas Instruments Incorporated
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