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R7KA8M2AFDCAM Scheda tecnica(PDF) 241 Page - Renesas Technology Corp |
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R7KA8M2AFDCAM Scheda tecnica(HTML) 241 Page - Renesas Technology Corp |
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241 / 295 page ![]() Table 2.94 A/D conversion characteristics (SAR mode : External VDD mode) (6 of 6) Conditions: AVCC: 2.7 to 3.63 V, VCC: 2.7 to 3.63 V, VREFH0/VREFH: 2.7 V to AVCC Parameter Min Typ Max Unit Test conditions SAR mode Differential input High accuracy mode High-speed channels (AN000 to AN005) (AN006 to AN011) Without channel dedicated sample and hold circuits Conversion time*1 0.26 — — µs ● ADCLK: 50 MHz ● Sampling time: 8 ADCLK ● Successive approximation time: 5 ADCLK ● Signal source impedance: 50 Ω or less Offset error — ±1 ±2.5 LSB — Full-scale error — ±1 ±2.5 LSB — Absolute accuracy — ±2 ±4 LSB — DNL differential nonlinearity error *3 — ±0.75 ±1 LSB — INL integral nonlinearity error — ±1.5 ±2 LSB — High-speed channels (AN000 to AN005) (AN006 to AN011) With channel dedicated sample and hold circuits Conversion time*2 1.72 — — µs ● ADCLK: 50 MHz ● Sampling time of channel- dedicated sample-and-hold circuits: 63 ADCLK ● Hold mode switching time of channel-dedicated sample-and- hold circuits: 2 ADCLK ● Sampling time: 16 ADCLK ● Successive approximation time: 5 ADCLK ● Signal source impedance: 50 Ω or less Offset error — ±1.5 ±6.75 LSB — Full-scale error — ±1.5 ±6.75 LSB — Absolute accuracy — ±3.5 ±9 LSB — DNL differential nonlinearity error *3 — ±1 -1 to +1.5 LSB — INL integral nonlinearity error — ±2.5 ±3.5 LSB — Note: These specification values are applicable when only one ADC16H is operating, DAC12 and ACMPHS are not operating, and there is no access to the external bus during A/D conversion. If other ADC unit, DAC12, or ACMPHS is operating or bus access occurs during A/D conversion, values might not fall within the indicated ranges. The use of ports 0 as digital outputs is not allowed when the ADC16H is used. The characteristics apply when AVCC0, AVSS0, VREFH0, VREFH, VREFL0, VREFL, and ADC16H input voltage is stable. Note 1. Without channel dedicated sample and hold circuits; The conversion time is the sum of the sampling time and the successive approximation time. Each of the above state is indicated for the test conditions. Note 2. With channel-dedicated sample-and-hold circuits; The conversion time is the sum of the sampling time of channel-dedicated sample-and-hold circuits, the hold mode switching time, the sampling time and the successive approximation time. Each of the above state is indicated for the test conditions. Note 3. DNL is measured using the Histogram Method, so the lower limit value is -1. RA8M2 Datasheet 2. Electrical Characteristics R01DS0438EJ0130 Rev.1.30 Feb 27, 2026 Page 241 of 295 |
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