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MPC8378E Scheda tecnica(PDF) 88 Page - Freescale Semiconductor, Inc |
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MPC8378E Scheda tecnica(HTML) 88 Page - Freescale Semiconductor, Inc |
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88 / 128 page ![]() MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8 88 Freescale Semiconductor Figure 63. Differential Measurement Points for Rise and Fall Time Figure 64. Single-Ended Measurement Points for Rise and Fall Time Matching Rising edge rate (SD n_REF_CLK) to falling edge rate (SD n_REF_CLK) matching Rise-Fall Matching — 20 % 1, 4 Notes: 1. Measurement taken from single ended waveform. 2. Measurement taken from differential waveform. 3. Measured from –200 mV to +200 mV on the differential waveform (derived from SD n_REF_CLK minus SDn_REF_CLK). The signal must be monotonic through the measurement region for rise and fall time. The 400 mV measurement window is centered on the differential zero crossing. See Figure 63. 4. Matching applies to rising edge rate for SD n_REF_CLK and falling edge rate for SDn_REF_CLK. It is measured using a 200 mV window centered on the median cross point where SDn_REF_CLK rising meets SD n_REF_CLK falling. The median cross point is used to calculate the voltage thresholds the oscilloscope is to use for the edge rate calculations. The Rise Edge Rate of SD n_REF_CLK should be compared to the Fall Edge Rate of SDn_REF_CLK, the maximum allowed difference should not exceed 20% of the slowest edge rate. See Figure 64. Table 67. SerDes Reference Clock Common AC Parameters (continued) At recommended operating conditions with XVDD_SRDS or XVDD_SRDS = 1.0 V ± 5%. Parameter Symbol Min Max Unit Note VIH = +200 mV 0.0 V VIL = –200 mV SD n_REF_CLK Minus SD n_REF_CLK Rise Edge Rate Fall Edge Rate TFALL TRISE SD n_REF_CLK VCROSS MEDIAN SD n_REF_CLK SD n_REF_CLK VCROSS MEDIAN SD n_REF_CLK VCROSS MEDIAN –100 mV VCROSS MEDIAN +100 mV |
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